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Feature structure scattering characteristic calculation method

A technology of characteristic structure and scattering characteristics, which is applied in the field of calculation of characteristic structure scattering characteristics, can solve problems such as inability to carry out calculations effectively, and achieve the effect of fast simulation

Pending Publication Date: 2021-12-03
SHANGHAI RADIO EQUIP RES INST
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Problems solved by technology

However, for the case where the characteristic structural unit is electrically large in size, neither of the above two types of methods can effectively carry out the calculation

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  • Feature structure scattering characteristic calculation method
  • Feature structure scattering characteristic calculation method
  • Feature structure scattering characteristic calculation method

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Embodiment Construction

[0021] based on the following Figure 1 ~ Figure 2 , specifically explain the preferred embodiment of the present invention.

[0022] Such as figure 1 As shown, the present invention provides a method for calculating characteristic structure scattering characteristics, comprising the following steps:

[0023] Step S1, establishing a finite array of feature structures (10 periods×10 periods or more), and selecting an appropriate low-frequency algorithm according to the calculation scale;

[0024] For large-scale calculation problems, the low-frequency algorithm generally chooses multi-layer fast multipole (MLFMM), and the time complexity and space complexity of this MLFMM solution to large-scale electricity are both O(NlogN), which is extremely efficient;

[0025] Step S2, such as figure 2 As shown, obtain the reflected electric field at a position 5-10 times wavelength away from the surface of the characteristic structure in the reflection direction symmetrical to the inci...

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Abstract

A feature structure scattering characteristic calculation method comprises the following steps: S1, establishing a finite array of feature structures, and selecting a low-frequency algorithm according to a calculation scale; s2, acquiring a reflection electric field at a position which is away from the surface of the feature structure by a fixed multiple of wavelength in a reflection direction which is symmetrical with the incident direction about the normal direction of the feature structure; s3, according to the definition of a reflection coefficient, calculating an approximate reflection coefficient of the feature structure in combination with the reflection electric field obtained in the step S2; and step S4, utilizing the approximate reflection coefficient obtained in the step S3, and adopting a bouncing ray method based on the characteristic reflection coefficient to simulate and calculate the scattering characteristic of the characteristic structure. The invention can efficiently calculate and accurately simulate the reflection coefficient of the electrically large feature structure unit which is difficult to solve.

Description

technical field [0001] The invention relates to radar target characteristic simulation technology, in particular to a characteristic structure scattering characteristic calculation method. Background technique [0002] Obtaining the scattering characteristics of characteristic structures by direct modeling is difficult to meet the practical needs in terms of time complexity and space complexity. The traditional way to solve this kind of problem is to use Floquet periodic boundary solution to obtain the reflection characteristics of the characteristic structure for the elements of the periodic structure, and then use the traditional high-frequency method to solve it. However, for the case where the characteristic structural units are electrically large in size, neither of the above two types of methods can carry out calculations effectively. Contents of the invention [0003] The purpose of the present invention is to provide a method for calculating the scattering charact...

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Application Information

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IPC IPC(8): G06F30/20
CPCG06F30/20
Inventor 高伟王晓冰廖意陈亚南张玉涛
Owner SHANGHAI RADIO EQUIP RES INST
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