Semi-automatic chip testing machine and working method

Abstract

The invention discloses a semi-automatic chip testing machine table and a working method. The semi-automatic chip testing machine table comprises a testing machine base, a testing table and an action mechanism, wherein the testing table is arranged on the testing machine base and is an open box body composed of a bottom plate, a back plate, a left supporting plate and a right supporting plate, and the testing table is used for placing a testing chip and executing a testing action; the action mechanism comprises an air cylinder, is arranged at a top end of the testing table and is used for automatically pressing the testing chip. The working method comprises the following steps of S101, electrifying the testing table; S102, loading a chip to be tested; S103, starting a chip test; S104, ending the chip test; and S105, outputting the chip test result. According to the method, the whole testing process is controlled by a program, human participation is reduced, testing efficiency of a memory chip is greatly improved, the error rate of pure manual testing is reduced, semi-automatic testing of the memory chip can be achieved, and a purpose of saving cost for enterprises can be achieved.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a semi-automatic chip testing machine and a working method. Background technique [0002] Memory chips are often called "memory particles". Memory chips are the core components of storage devices. The quality of memory chips can directly affect the performance of storage devices. Because the chip has a certain defect rate, the memory chip must be strictly tested before its application. [0003] In the prior art, the memory chip is often tested manually, such as loading the memory chip into a specific jig, and then the worker inserts the jig with the memory chip into the test equipment, and then performs the test. After the test, the worker Pull the clamp off manually. This manual operation method is very inefficient, requires a lot of labor costs, and is prone to errors in any link in the testing process, thereby affecting the testing efficiency. [0004] In view of this,...

AI Technical Summary

Problems solved by technology

This manual operation method is very inefficient and requires a lot of labor costs, and it is prone to errors in any link in the test process, which affects the test efficiency.

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