Local strength testing device for chip testing
A technology of strength testing and chip testing, applied in the direction of using a single impact force to test the strength of materials, can solve problems such as uneven force on the surface, and achieve the effect of solving the uneven force on the surface and preventing the impact of the impact head from affecting the test.
Active Publication Date: 2022-02-11
宜宾卓邦科技有限公司
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Problems solved by technology
[0004] Aiming at the deficiencies of the prior art, the present invention provides a local strength testing device for chip testing, which solves the impact of vibration on the strength test data, mechanical pressure on the chip during strength testing, and long-term extrusion of the impact head to cause surface damage. The problem of uneven force
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[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0025] Such as Figure 1-7 As shown, a local strength testing device for chip testing includes a top case 1, a fixed arm 2 is fixedly connected to the lower end of the top case 1, a fixed clip 3 is slidably connected to the lower end of the fixed arm 2, and the fixed clip 3 is close to one end of the fixed arm 2. A clamping spring 4 is connected, a rotating motor 5 is fixedly connected to the inner groove of the top case 1 , a linkage sleeve 6 is fixedly conne...
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The invention provides a local strength testing device for chip testing, which relates to the field of chip testing. The local strength testing device for chip testing comprises a top shell, the lower end of the top shell is fixedly connected with a fixing arm, the lower end of the fixing arm is slidably connected with a fixing clamp, the end, close to the fixing arm, of the fixing clamp is sleeved with a clamping spring, an inner groove of the top shell is fixedly connected with a rotating motor, the output end of the rotating motor is fixedly connected with a linkage sleeve, a positioning frame is fixedly connected to the lower end of the top shell, an adjusting ring is fixedly connected to the inner side of the positioning frame, and a limiting shell is rotationally connected to the outer surface of the adjusting ring. According to the local strength testing device for chip testing, the pressure ring always applies pressure to the supporting claw, so that the balance frame always keeps upward pressure, and the impact head has a resilience trend after being not stressed through the elasticity of the supporting claw, so that the impact head is prevented from vibrating on the surface of the chip, and the effect of eliminating the influence of vibration on the strength test is achieved; and the problem of influence of vibration on strength testing data is solved.
Description
technical field [0001] The invention relates to the field of chip testing, in particular to a local strength testing device for chip testing. Background technique [0002] Chips are also known as microcircuits, microchips, and integrated circuits. They are actually a general term for semiconductor component products. There are many classifications of chips, which can be divided into analog chips and digital chips according to different processing signals. Simply put, analog chips use the amplification effect of transistors, while digital and analog chips use the switching effect of crystals. [0003] After the chip is made, it needs to go through various tests before it can be put into use. Among them, the local strength of the chip needs to be tested a lot, but the existing test device can not eliminate the tremor after clicking, which will seriously affect the experimental data. For this purpose, a local Strength testing device. Contents of the invention [0004] Aimi...
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IPC IPC(8): G01N3/30
CPCG01N3/30
Inventor 艾静
Owner 宜宾卓邦科技有限公司