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Particle screening method and device

A screening algorithm and particle technology, applied in measuring devices, neutron radiation measurement, instruments, etc., can solve problems such as different neutron gamma signal response principles, different front-end readout systems, and energy consumption of debuggers

Pending Publication Date: 2022-03-01
UNIV OF SCI & TECH OF CHINA
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Problems solved by technology

[0002] In the field of radiation detection and particle screening, selecting different particle detectors according to actual scenarios and using various nuclear instruments with data acquisition to complete particle screening tasks is a common test method in various experiments, but because of different Types have different response principles to neutron gamma signals, the required discrimination algorithms are also different, and the corresponding front-end readout systems are also different, so various customized systems are often required in actual measurement
[0003] Generally speaking, the quality of the particle screening algorithm is very dependent on the selection of the screening parameter value, and repeated testing to find the target screening parameter value matching the detector is a kind of repetitive work, which will consume a lot of time. When it is necessary to change the readout circuit During design, the corresponding target screening parameter values ​​may change, which will bring more energy consumption to the debugger

Method used

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Embodiment Construction

[0048] Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. It should be understood, however, that these descriptions are exemplary only, and are not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the present disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present disclosure.

[0049] The terminology used herein is for the purpose of describing particular embodiments only, and is not intended to be limiting of the present disclosure. The terms "comprising", "comprising", etc. used herein indicate the presence of stated features, ...

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Abstract

The invention provides a particle discrimination method and device. The method comprises the following steps: acquiring a plurality of characteristic parameters of waveforms of particles emitted by a detector; and selecting a plurality of discrimination algorithms matched with the plurality of feature parameters from an algorithm list according to the plurality of feature parameters. And selecting one discrimination algorithm from the plurality of discrimination algorithms, and calculating a quality factor, corresponding to each discrimination parameter value, of the discrimination algorithm according to the plurality of discrimination parameter values corresponding to the discrimination algorithm. And determining an optimal quality factor and an optimal discrimination parameter value of the discrimination algorithm from the plurality of quality factors. And repeating the steps to obtain the optimal quality factor and the optimal screening parameter value of each screening algorithm. And according to the optimal quality factor of each discrimination algorithm, determining a target quality factor, determining a target discrimination algorithm corresponding to the target quality factor, and taking an optimal discrimination parameter value corresponding to the target discrimination algorithm as a target discrimination parameter value.

Description

technical field [0001] The present disclosure relates to the field of electronic measuring instruments, in particular to a particle screening method and device. Background technique [0002] In the field of radiation detection and particle screening, selecting different particle detectors according to actual scenarios and using various nuclear instruments with data acquisition to complete particle screening tasks is a common test method in various experiments, but because of different Different types have different response principles to neutron gamma signals, the required screening algorithms are also different, and the corresponding front-end readout systems are also different. Therefore, various customized systems are often used in actual measurement. [0003] Generally speaking, the quality of the particle screening algorithm is very dependent on the selection of the screening parameter value, and repeated testing to find the target screening parameter value matching the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/38G01T3/00G06F17/10G06F17/18
CPCG01T1/38G01T3/00G06F17/10G06F17/18
Inventor 陈炼徐晓禹金革
Owner UNIV OF SCI & TECH OF CHINA
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