Multi-parameter configuration method suitable for power cycle test

Abstract

The invention relates to a multi-parameter configuration method suitable for a power cycle test. The method comprises the following steps: step 1, extracting an output parameter and a set of independent input parameters corresponding to the output parameter; 2, determining a rule curve of the output parameter and any independent input parameter in the independent input parameter set; step 3, establishing a rule memory, and utilizing the rule memory to store an output and input parameter rule association scheme; and 4, setting an output parameter target value of the power cycle test, and determining a corresponding input parameter target value according to the output parameter target value and a rule curve in the output and input parameter rule scheme after the output and input parameter rule scheme is found, so as to realize configuration of a plurality of input parameters in the power cycle test. According to the invention, the configuration of the target environment parameters in the power cycle test can be effectively realized, and the efficiency and reliability of the power cycle test are improved.

Description

technical field [0001] The invention relates to a multi-parameter configuration method, in particular to a multi-parameter configuration method suitable for power cycle tests. Background technique [0002] For a power semiconductor device, the purpose of the power cycle test is to test the loss of each characteristic parameter of the power semiconductor device in a switching state under a specific test environment. Before the formal test of the power cycle of the power semiconductor device, it is necessary to configure the target environmental parameters of the test, such as the ambient temperature, the flow and temperature of the circulating water circuit, and the circulating power. [0003] In order to allow the power cycle test to be carried out in the target environment, people often manually adjust the input parameter values ​​to achieve the actual target environment parameters (ie input parameters) to match the target environment. In addition, the exhaustive arrangeme...

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Problems solved by technology

[0004] For the above-mentioned existing method for adjusting the input parameter value, there are mainly the following problems: 1), the number of input parameters must be limited, if the number of input parameters affecting the output parameter is infinite, this method cannot achieve the ultimate goal

2) When adjusting the input parameter value, it is impossible to limit the adjustment step size of each input parameter. For example, to increase the temperature of the circuit, the flowing current in the circuit can be increased, so the desired test environment must be accurately achieved, each time The magnitude of the increase cannot be determined

3) If the number of input parameters is infinite, it will take a lot of time and it is difficult to improve productivity

[0006] 1) It takes at least 2-4 hours or even longer to configure the target environment parameters once, which greatly consumes manpower and time;

[0007] 2) In the process of manual adjustment, there are many input parameters to be adjusted, and the coupling relationship between parameters is complicated, so it is not easy to achieve the goal; for example, the target of the packaged device is Tvj (junction temperature) of 90 degrees Celsius for power cycle test, within the allowable range Internal adjustment of Iheat (heating current) can increase Tvj to a maximum of 60 degrees Celsius. At this time, Iheat has reached the limit value of the circuit. To make Tvj continue to increase, other input parameters such as VGEheat or OpeningValue need to be adjusted;

[0008] 3) The maneuverability is poor, and there are problems of multi-parameter interaction and combination

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