Material identification method and device and storage medium
A material identification and identification technology, which is applied in the material analysis using radiation diffraction, etc., can solve the problems of long detection time, poor material identification timeliness, limited flux, etc., and achieve the effect of improving efficiency
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[0048] The technical solutions in the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. It should be understood that the specific embodiments described here are only used to explain the related application, not to limit the application. It should also be noted that, for the convenience of description, only the parts related to the relevant application are shown in the drawings.
[0049] The invention provides a material identification method, which is applied to a material identification device, figure 1 It is a schematic flowchart of a material identification method provided by an embodiment of the present invention. Such as figure 1 As shown, it mainly includes the following steps:
[0050] S101. Obtain an approximate scattering point and a scattering angle corresponding to each particle among the plurality of radiation particles passing through the detection area where...
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