Simulation method, detection method, device, equipment and storage medium

Abstract

The invention provides a simulation method, a detection method, devices, equipment and a storage medium, and the simulation method comprises the steps: obtaining a set model file which is used for representing the array structure of a to-be-simulated memory and the behavior of the to-be-simulated memory; converting the set model file into an intermediate file which can be read by a set simulator; adding the intermediate file to a running environment of a set simulator; obtaining a randomized file; generating a randomized excitation signal according to the randomized file; and simulating the behavior of the memory to be simulated according to the randomized excitation signal and the intermediate file. According to the memory simulation method and device, random simulation of the to-be-simulated memory can be achieved, the coverage rate of simulation can be increased, and even full-array simulation can be conducted on the to-be-simulated memory so as to fully simulate behaviors of the memory. In addition, the fault address can be accurately positioned based on the simulation method, the memory can be conveniently detected, and the detection efficiency is improved.

Description

technical field [0001] The present disclosure relates to but not limited to the technical field of semiconductors, and in particular relates to a simulation method, a detection method, a device, a device and a storage medium. Background technique [0002] At present, when simulating a memory, it can only be simulated for an array corresponding to a specific row address and a specific column address, and the coverage rate of the simulation is very low, and the behavior of the memory cannot be fully simulated. [0003] In addition, because the current simulation can only target part of the array of the memory, it is impossible to accurately locate the fault address, which affects the detection of the memory. Contents of the invention [0004] The following is an overview of the subject matter described in detail in this disclosure. This summary is not intended to limit the scope of the claims. [0005] The disclosure provides a simulation method, a detection method, a devi...

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Problems solved by technology

[0002] At present, when simulating memory, it can only simulate the array corresponding to a specific row address and a specific column address. The coverage of the simulation is very low, and the behavior of the memory cannot be fully simulated.

[0003] In addition, since the current simulation can only target part of the memory array, it is impossible to accurately locate the fault address, which affects the detection of the memory

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