Sample bearing device for electron microscope

A sample carrying device, electron microscope technology, applied in the field of microscopy, can solve the problems of single function, limited sample rod versatility, poor sample rod versatility, etc., to achieve the effect of improving versatility

Pending Publication Date: 2022-03-18
TSINGHUA UNIV
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore existing sample bar has the following deficiencies: (1) sample bar is only suitable for one type of sample detection, which limits the versatility of sample bar; Poor versatility of the sample holder

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Sample bearing device for electron microscope
  • Sample bearing device for electron microscope
  • Sample bearing device for electron microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0034] Refer below Figure 1-Figure 4 Describe a sample carrying device 100 for an electron microscope according to an embodiment of the present invention, the electron microscope is a transmission electron microscope, the sample carrying device 100 is used to connect with the sample rod of the electron microscope, and the sample rod is used to carry the sample to be tested, further , the sample carrying device 100 carries the sample to be tested, the sample rod can move with the sample carrying device 100 , and the sample rod can also r...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a sample bearing device for an electron microscope, the sample bearing device is used for being connected with a sample rod, and the sample bearing device comprises a base body; the tilting base is arranged on the base body and can rotate relative to the base body, and the tilting base is suitable for bearing a sample; and the sample bearing assembly is detachably mounted on the tilting base, and the sample bearing assembly is used for bearing a sample. Therefore, by placing the sample on the tilting base or the sample bearing assembly, the sample bearing device can bear different types of samples, and the different types of samples can be compatibly used on the same sample rod, so that the universality of the sample rod can be improved.

Description

technical field [0001] The invention relates to the field of microscopes, in particular to a sample carrying device for an electron microscope. Background technique [0002] Transmission electron microscope is the core equipment for characterizing and studying the microstructure of materials. The sample rod of the electron microscope is used to carry the sample to be tested, and is one of the key components of the transmission electron microscope. With the continuous deepening of material science research, higher requirements are put forward for the observation and characterization of material microstructure based on transmission electron microscopy. It is necessary to apply various external fields to the sample in situ while performing double-tilt observation on the sample. , including: various external environments such as heat, cold, electricity, force, gas, liquid, etc. These external environments generally require sample rods to provide, so this type of sample rod is a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04G01N23/20G01N23/20008G01N23/20025
CPCG01N23/04G01N23/20G01N23/20008G01N23/20025
Inventor 申玉田朱跃峰
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap