Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Test device, test system and test method

A testing device and testing system technology, applied in the direction of measuring device, single semiconductor device testing, measuring electricity, etc., can solve the problems of high-efficiency detection of display screen and camera, difficult detection of display screen and camera, and low detection efficiency, etc. The effect of realizing large-scale testing and improving testing efficiency

Active Publication Date: 2022-03-18
SUZHOU CHINA STAR OPTOELECTRONICS TECH CO LTD
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Some embodiments of the present application can overcome the problem of low detection efficiency due to the need to frequently separate the display screen and camera when performing quality inspection on the display screen and camera alone
Other embodiments of the present application can also overcome the problem that existing detection devices cannot simultaneously perform high-efficiency detection on the display screen and the camera
Some other embodiments of the present application can also solve the problem that it is difficult to use a unified detection device to detect the display screen and the camera

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test device, test system and test method
  • Test device, test system and test method
  • Test device, test system and test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0052] The following will clearly and completely describe the technical solutions in the embodiments of the application with reference to the drawings in the embodiments of the application. Apparently, the described embodiments are only some of the embodiments of the application, not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of this application. In addition, it should be understood that the specific implementations described here are only used to illustrate and explain the present application, and are not intended to limit the present application. In this application, unless stated to the contrary, the used orientation words (if any) such as "up" and "down" usually refer to the up and down in the actual use or working state of the device, specifically in the drawings The direction of the drawing; and "inside" and "outside" (if any) refer...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a test device, a test system and a test method. The display screen of the screen and camera shooting integrated equipment is fixed by the fixed carrying platform, the camera assembly is placed by the test module, and the camera assembly and / or the display screen and the test module form the communication loop for signal test by the crimping module, so that the signal test can be performed on the screen and camera shooting integrated equipment. When display screens and / or cameras of different specifications are tested, only the test module needs to be replaced on the whole, rewiring is not needed, the camera assembly and the display screens can be tested in sequence or at the same time, the test efficiency can be greatly improved, and the wire replacement burden can be reduced.

Description

technical field [0001] The present application relates to the technical field of display device testing, in particular to a testing device, testing system and testing method. Background technique [0002] Display devices include components such as display screens and cameras. In order to control the quality of display equipment, it is necessary to use test equipment to test the quality of these components. Only after passing the test can it be assembled into a finished product. [0003] The current quality test tests the quality of the display screen and the camera separately. During the inspection, it is necessary to first separate the Flexible Printed Circuit (FPC) connection (FPC connection for short) between the display screen and the camera, and then use different The testing device performs quality testing on the display screen and the camera respectively. This detection method is easy to damage the flexible circuit board during separation, which may cause problems ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/26
CPCG01R31/00G01R31/26
Inventor 罗军张文兵高峰
Owner SUZHOU CHINA STAR OPTOELECTRONICS TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com