Root cause location method, device, equipment, medium and product of abnormal production

Abstract

Embodiments of the present application provide a root cause location method, device, equipment, medium, and product for abnormal production. The method obtains equipment history information and defect rate information of the target batch of products; based on the target level in the equipment history information, history information, construct a plurality of virtual parallel units along the target path; based on the equipment history information and defect rate information of the target batch of products, obtain the defect concentration value of each virtual parallel unit; based on each of the virtual parallel units Bad concentration values ​​for cells to determine the root cause of the anomaly. This method can improve the accuracy of the location of the root cause of the defect; especially for the situation where there is less data when there is a sudden defect in the product production process, it can significantly improve the accuracy of the root cause location of the defect, and solve the problem of the location accuracy of the root cause of the product production process. Low technical issues.

Description

technical field [0001] The invention relates to the technical field of production control, in particular to a root cause location method, device, equipment, medium and product for abnormal production. Background technique [0002] The product production process (for example, panel production) generally includes multiple production links, and each production process involves a large number of complex processes, and these processes are completed by a series of equipment configured in series or in parallel. In actual production, in the face of large-scale production equipment, it becomes more difficult to carry out effective equipment control and positioning analysis that affects product quality. Especially when a sudden abnormal fault occurs, the accuracy of root cause location is low. Contents of the invention [0003] The main purpose of this application is to provide a method, device, equipment, medium and product for root cause location of production abnormalities, and ...

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Problems solved by technology

[0003] The main purpose of this application is to provide a method, device, equipment, medium and product for root cause location of production abnormalities, and to solve the technical problem of low accuracy of root cause location in the production process of existing products

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