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Radio frequency integrated circuit test device and test platform

A technology of radio frequency integrated circuits and testing devices, which is applied in the direction of electronic circuit testing, etc.

Pending Publication Date: 2022-04-05
BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In order to solve the test efficiency problem of testing various radio frequency parameters, the application provides a radio frequency integrated circuit test device and test platform

Method used

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  • Radio frequency integrated circuit test device and test platform
  • Radio frequency integrated circuit test device and test platform
  • Radio frequency integrated circuit test device and test platform

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Embodiment Construction

[0043] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, but not all of them. Based on the embodiments in the present application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present application.

[0044] The first embodiment of the present application provides a radio frequency integrated circuit testing device, which can be applied to such as figure 1As shown in the system architecture, the system architecture includes at least a hardware platform 101 and a software platform 102. The hardware platform 101 and the software platfo...

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Abstract

The invention relates to a radio frequency integrated circuit testing device and a testing platform, and belongs to the technical field of integrated circuit testing. According to the radio frequency integrated circuit testing device, a vector modulation and demodulation module is used for generating a first baseband signal and transmitting the first baseband signal to a radio frequency emission conditioning module; the radio frequency emission conditioning module is used for generating a first vector signal according to a first baseband signal sent by the vector modulation and demodulation module, and transmitting the first vector signal to a to-be-tested device through the switch matrix module; the radio frequency receiving and conditioning module is used for receiving a second vector signal returned by the device to be tested based on the first vector signal through the switch matrix module, demodulating the second vector signal to obtain a second baseband signal, and transmitting the second baseband signal to the vector modulation and demodulation module; the vector modulation and demodulation module is further used for obtaining a test result of the device to be tested according to the first baseband signal and the second baseband signal, various radio frequency parameters can be tested at a time, a test instrument does not need to be frequently replaced, and the test efficiency is improved.

Description

technical field [0001] The present application relates to the technical field of integrated circuit testing, in particular to a radio frequency integrated circuit testing device and a testing platform. Background technique [0002] With the continuous development of radio frequency integrated circuits, the test requirements are getting higher and higher, and the test requirements of radio frequency integrated circuits are highly complex, involving a variety of radio frequency parameters, including frequency, power, noise figure, standing wave ratio, harmonic suppression, Spurious suppression, insertion loss, gain, third-order intermodulation, IF bandwidth, etc. Completing the above parameter tests requires the cooperation of spectrum analyzers, vector signal analyzers, vector signal sources, noise figure analyzers, vector network analyzers and other radio frequency instruments. For a variety of radio frequency integrated circuits of the same type, in order to improve the te...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 冯建呈郑永丰闵昆龙杨旸闫丽琴李明军刘延迪刘治超张少帅张洋白晓远王奇之孟旭王梦琪李广振王占选
Owner BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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