Modularized testing device and testing equipment applied by modularized testing device

Abstract

The invention provides a modularized testing device which comprises a bearing unit, a testing unit and a crimping unit, a carrier of the bearing unit bears the slidable testing unit, a bearing plate of the testing unit is provided with a plurality of testers, the testers are used for bearing and testing a plurality of electronic components, and the crimping unit is assembled on the carrier of the bearing unit through a detachable frame. The frame is provided with a plurality of crimping devices, and the plurality of crimping devices are aligned with the plurality of testers, so that the modularized testing device is beneficial to maintenance and replacement, a batch of a plurality of electronic components can be conveniently taken and placed when the testing unit slides out of the carrier, and the crimping unit crimps the plurality of electronic components to execute testing operation when the testing unit slides into the carrier. And the use efficiency is further improved.

Description

technical field [0001] The invention relates to a modularized testing device which is convenient for maintenance and replacement and improves operation convenience. Background technique [0002] Nowadays, after the electronic components are manufactured, testing equipment must be used to test the electronic components to eliminate defective products. see figure 1 At present, the test equipment is equipped with a feeding device 12 and a receiving device 13 in the front section of the machine 11, and a plurality of testing devices 14A, 14B, 14C, 14D, 14E, and 14F are arranged horizontally in the rear section, with the testing device 14A as the For example, two electrically connected test sockets 141A and a circuit board 142A are fixed on the machine platform 11 to perform testing operations on electronic components. The test device 14A is also provided with a frame 143A on the machine platform 11, and the frame 143A is assembled and crimped. Crimping device 144A, crimping de...

AI Technical Summary

Problems solved by technology

see figure 1 At present, the test equipment is equipped with a feeding device 12 and a receiving device 13 in the front section of the machine 11, and a plurality of testing devices 14A, 14B, 14C, 14D, 14E, and 14F are arranged horizontally in the rear section, with the testing device 14A as the For example, two electrically connected test sockets 141A and a circuit board 142A are fixed on the machine platform 11 to perform testing operations on electronic components. The test device 14A is also provided with a frame 143A on the machine platform 11, and the frame 143A is assembled and crimped. Crimping device 144A, crimping device 144A is corresponding to test seat 141A, for the electronic component in the press test seat 141A to carry out test operation; Electronic components, and move an electronic component to be tested into the test socket 141A to continue the test operation, and so on, the conveyor 15 performs the taking out of the tested electronic component and the The operation of placing the electronic components to be tested; however, the conveyor 15 must reciprocate multiple times to enter and exit a plurality of test devices 14A, 14B, 14C, 14D, 14E, and 14F before moving in or out a single electronic component, which not only increases the operating sequence and consumes time, reducing test productivity

In addition, when replacing different types of test sockets, circuit boards, and crimping devices, the test sockets, circuit boards, and crimping devices must be disassembled one by one from each test device 14A, 14B, 14C, 14D, 14E, and 14F, resulting in tedious and time-consuming replacement operations. Time

Furthermore, the testing device 14A must increase the erection height of the frame 143A and the crimping device 144A so that the conveyor 15 can be moved between the crimping device 144A and the test seat 141A, which not only increases the volume of the testing device 14A, but also extends the length of the test device 14A. The pressing stroke of the crimper 144A increases the working time

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