Product defect detection method and device, storage medium and electronic equipment

A defect detection and product defect technology, which is applied in the direction of instruments, character and pattern recognition, computer components, etc., can solve the problems of low detection accuracy and high transmission damage, improve matching, improve accuracy and real-time performance, and reduce network transmission damage effect

Pending Publication Date: 2022-04-15
CHINA TELECOM CORP LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present disclosure is to provide a product defect detection method, a product defect detection device, a computer-readable storage medium, and an electron

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Product defect detection method and device, storage medium and electronic equipment
  • Product defect detection method and device, storage medium and electronic equipment
  • Product defect detection method and device, storage medium and electronic equipment

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0058] An example embodiment will now be described more fully with reference to the accompanying drawings. However, the example embodiments can be implemented in a variety of forms, and should not be construed as being limited to the examples set forth herein; in contrast, the present disclosure will make the present disclosure more comprehensive and complete, and to comprehensively convey the concept of an example embodiment A technician to those skilled in the art. The features, structures, or characteristics described may be incorporated in one or more embodiments in any suitable manner. In the following description, there is provided a number of specific details to give a sufficient understanding of the embodiments of the present disclosure. However, those skilled in the art will appreciate that one or more of the present disclosure may be practiced, or other methods, components, devices, steps, and the like can be applied. In other cases, the well-known technical solutions ar...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the technical field of product detection, and relates to a product defect detection method and device, a storage medium and electronic equipment. The method comprises the following steps: acquiring an edge side resource and a task demand resource corresponding to a to-be-detected product, and performing resource matching calculation on the edge side resource and the task demand resource to obtain a resource matching value; obtaining a matching threshold value corresponding to the resource matching value, and comparing the resource matching value with the matching threshold value to obtain a matching comparison result; and performing defect detection on the to-be-detected product according to a matching comparison result. Defect detection is carried out on the to-be-detected product by calculating the resource matching value, the association degree of the production line and the edge side is improved, the matching degree of the defect detection task load and the edge resources is also improved, various resources of the edge side are reasonably utilized, the network bandwidth pressure and the network transmission damage are reduced, and the detection efficiency is improved. And the precision and the real-time performance of defect detection are improved.

Description

technical field [0001] The present disclosure relates to the technical field of product detection, and in particular to a product defect detection method, a product defect detection device, a computer-readable storage medium, and electronic equipment. Background technique [0002] Defect detection is an important link in the field of industrial manufacturing, and has extremely high requirements for real-time and accuracy. With the application of edge computing in the industrial field, how to effectively use the edge computing architecture, improve the utilization of edge resources, reduce network pressure, and improve the accuracy and real-time performance of defect detection has become the focus of research in the industrial field. [0003] Usually, the defect detection pictures are uploaded to the cloud for defect detection. However, since defect detection pictures are uncompressed ultra-high-definition pictures, uploading them to the cloud will occupy a large amount of b...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06V10/75G06K9/62G06V10/44
Inventor 薛裕颖丁鹏沈云宋雅奇段惠斌
Owner CHINA TELECOM CORP LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap