Electrical element comprehensive test system

Abstract

The invention relates to an electrical element comprehensive test system comprising an AC/DC power supply control device used for providing a plurality of working power supplies with different amplitudes for a loop of the test system; the embedded control device is used for controlling power devices in the AC/DC power supply control device so as to output working power supplies with different amplitudes, acquiring real-time voltages of the multiple ADC channels in real time, processing the real-time voltages, and packaging and sending the real-time voltages; the touch display device is connected with a data serial port of the embedded control device and is used for displaying a test waveform and carrying out man-machine interaction; the digital signal input and output circuit is respectively connected with a data input end and a data output end of the embedded control device; and the contact power supply circuit is electrically connected with the electrical element to be detected and is used for triggering the operation of the electrical element. The device can be suitable for testing different types of coil products in the low-voltage electric appliance industry, the testing precision is high, the working reliability is good, the testing result can be visually displayed, and testers can conveniently judge and trace problems.

Description

technical field [0001] The invention relates to the technical field of testing equipment, in particular to testing equipment in the field of electronics and electricity, and in particular to a comprehensive testing system for electrical components. Background technique [0002] In order to be able to measure the performance of electrical components, and then to achieve product quality control and provide a test basis for product development, the existing solutions for testing electrical components on the market basically use DSP chips for sampling, but the DSP chip itself processes performance in parallel. It is very low, so it can only be sampled serially and time-sharing, resulting in a single-channel sampling frequency of only about 1KHz, that is, the sampling period is about 1ms, and for the contactor test system, the sampling period of 1ms cannot achieve the key of the contactor at all. Performance testing leads to insufficient measurement accuracy and sampling frequenc...

AI Technical Summary

Problems solved by technology

[0002] In order to be able to measure the performance of electrical components, and then to achieve product quality control and provide a test basis for product development, the existing solutions for testing electrical components on the market basically use DSP chips for sampling, but the DSP chip itself processes performance in parallel. It is very low, so it can only be sampled serially and time-sharing, resulting in a single-channel sampling frequency of only about 1KHz, that is, the sampling period is about 1ms, and for the contactor test system, the sampling period of 1ms cannot achieve the key of the contactor at all. Performance testing leads to insufficient measurement accuracy and sampling frequency, and large errors in measurement data

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