Detection device and detection system of test board
A detection device and detection system technology, which is applied in the direction of electrical connection testing, etc., can solve the problems of non-foolproofness in the testing process, unfavorable automatic testing of production lines, and reduced service life of testing interfaces, so as to realize automatic testing, improve testing reliability, The effect of saving test time
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Embodiment 1
[0044] This embodiment provides a detection device for a test board, figure 1 A schematic diagram of the signal relationship of a detection device for a test board provided in Embodiment 1 of the present invention; the detection device includes a first gating switch 1, a second gating switch 2, a Type-C interface 3 and a controller; Type-C Interface 3 includes CC pins 31 and differential signal pins 32, and test board 4 includes first CC test pins 41, second CC test pins 42, first differential signal test pins 43 and second differential signal test pins 44; the controller is used to output the first switch control signal to the strobe pin 11 of the first strobe switch 1, and output the second switch control signal to the strobe pin 21 of the second strobe switch 2; Type-C interface 3 Connect to the test board 4 through the first strobe switch 1 and the second strobe switch 2 respectively, and select the CC pin 31 and the first CC test pin 41 or the second CC test pin according...
Embodiment 2
[0111] This embodiment provides a detection system for a test board, and the detection system includes a test board and any detection device in Embodiment 1.
[0112]In the detection system of the test board of this embodiment, the function of the test board is detected by the detection device of the test board, and in the case of a single insertion of the USB device, the first CC test pin, The second CC test pin, the first differential signal test pin and the second differential signal test pin are tested, thereby realizing the detection of the test board function, avoiding manual repeated plugging and unplugging of USB devices, and prolonging the test life of the Type-C interface. Reduce the hardware design and production cost of the test board, save test time, realize automatic test, and improve test reliability.
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