Low-cost fabric flaw detection system and method
A defect detection, low-cost technology, applied in the direction of image analysis, instruments, calculations, etc., can solve the problems of defect detection accuracy, accuracy impact, increase the workload of cloth inspectors, and cannot reduce labor costs, so as to improve accuracy and Its own robustness, solving the problem of fabric defect detection, improving performance and the effect of generalization ability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0037] The present invention will be described in further detail below with reference to the accompanying drawings and specific embodiments.
[0038] The invention designs a set of low-cost fabric defect detection system and method, realizes efficient and accurate labeling of fabric defects, and has multiple functions such as marking the position, quantity and type of defects. In addition, the system can accurately identify "fatal" defects and ordinary defects, provide alarms or shutdowns, so that managers can make timely corrections, thereby controlling fabric quality. Different from the detection equipment on the market that needs to rely on industrial cameras or infrared rays, the hardware of the fabric defect detection system only needs a traditional camera to achieve accurate and multi-functional defect detection, which greatly reduces the manufacturing cost of the detection equipment.
[0039] The entire workflow of the fabric defect detection system is: install the trad...
PUM
![No PUM](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap