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Observer used in conjustion with atom force microscope

An atomic force microscope and observation device technology, applied in microscopes, instruments, optics, etc., can solve problems such as small numerical aperture, achieve large numerical aperture, facilitate operation, and shorten the conjugate distance

Inactive Publication Date: 2004-07-07
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
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AI Technical Summary

Problems solved by technology

Although the stereomicroscope provided in the prior art has a larger working distance, the numerical aperture is smaller, and it adopts a non-common optical path reflective illumination structure (refer to the prior art [2] "Optical Technology Handbook", edited by Wang Zhijiang , Volume 2, Mechanical Industry Press, Beijing, 1994, Chapter 3 , 4 , 4.9 , p657~658)

Method used

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  • Observer used in conjustion with atom force microscope
  • Observer used in conjustion with atom force microscope

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Embodiment Construction

[0014] Such as figure 1 structure shown. The light source 506 is a white light source, and the diameter of the light beam exit plane of the optical fiber bundle 505 is 8mm. The magnification of the imaging optical path is 5 times, the working distance is 50mm, the numerical aperture is 0.25, and the conjugate distance is 200mm. The illuminating lens 504 adopts a single lens having the same structure as the rear lens 503 . The camera 6 is a 1 / 4 "color charge-coupled device (CCD) camera. The distance between the light beam exit planes from the illumination lens 504 to the light transmission fiber bundle 505 is the illumination object distance L 物 =81.95mm, the distance between the rear lens 503 and the receiving surface 601 of the camera 6 is the observation image distance L' 像 =81.95mm. Observing the needle tip 301 according to the adjustment steps of the above-mentioned coarse focus adjustment and fine focus adjustment, a clear image can be seen, and the resolution can rea...

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Abstract

An observer used in conjunction with atomic microscope is composed of rotary handwheel, leading screw in vertical column driven by the rotary handwheel, coarse focusing mechanism, fine focusing mechanism, first central light axis composed of optical fibre, lighting lens, and semi-reflecting semi-transmitting splitter, and second central light axis consisting of movable and fixed lenses, semi-reflecting semi-transmitting splitter, rear lens and camera. Its advantages are simple regulating mechanism, longer working distance of object lens, and big numerical aperature of object lens.

Description

Technical field: [0001] The invention is an observation device matched with an atomic force microscope. It is mainly used to observe the front, back, left, and right positions and states of the probe tip on the atomic force microscope. Background technique: [0002] When the atomic force microscope is used, it is equipped with an observation device. The observation device plays the role of selecting the sample measurement area, positioning the probe tip accurately, and monitoring the operation process of the atomic force microscope. The viewing device is an indispensable device in most applications of atomic force microscopy. Because the scanning range of the atomic force microscope is very small, generally less than 10 μm, without the help of the observation device, it is difficult for the probe tip to be positioned in the area to be measured; Or damaged during AFM operation. The observation device matched with the atomic force microscope has different requirements compa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B21/00G02B21/24
Inventor 徐文东干福熹
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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