Process flow for mfg. chip capable of pretesting efficiency, and testing method thereof
A test program and chip technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as waste, increase production costs, and weaken product competitiveness, so as to ensure efficiency and reduce waste.
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[0048] First, see figure 2 , is a flow chart of a preferred embodiment of the chip manufacturing process of the present invention. As shown in the figure, first, after the design of the chip is completed 201, the chip design is first verified in a simulation environment to see whether the chip design can respond correctly to each command 203, if the response is incorrect, return to Step 201 re-examines and corrects the design of the chip; if the response is correct, then the performance test of the chip design can be carried out to analyze whether its performance reaches the predetermined standard 205, if the performance fails to meet the standard, then return to step 201 and start again Revise the design of the chip; if its performance can reach the standard, the actual production of the chip can start 207 . In this way, before the actual mass production of the chip, the correctness of the chip design and the superiority of the performance can be tested first, reducing the ...
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