Aid device for inspection system and display method therefor
A technology for supporting devices and display methods, applied in measuring devices, instruments, measuring ultrasonic/sonic/infrasonic waves, etc., can solve the problems of complex genetic algorithm control, difficult to incorporate exploration methods, and judgment of qualified and unqualified.
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[0062] First, a brief description will be given of the abnormal sound inspection device that is the object of setting feature quantities and parameters in the embodiment of the present invention. The abnormal sound inspection device calculates a plurality of specified feature quantities after preprocessing the waveform data obtained by the vibration sensor or the sound microphone, and uses the effective calculation results from the calculation results to determine whether the qualified product / rejected product / Uncertain judgment as the basic structure. As such a pre-processing filter, a plurality of types of filters such as a band-pass filter, a low-pass filter, and a high-pass filter are prepared, and a plurality of feature quantities to be calculated are also prepared.
[0063] Effective pre-processing, feature quantities, etc., which are approximately determined for pass / fail judgment by inspection objects, may include processes that uselessly calculate feature quantities ...
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