Back light apparatus

A backlight device, light source technology, applied in optics, nonlinear optics, instruments, etc., can solve problems such as increased brightness deviation

Inactive Publication Date: 2007-02-21
PHICOM CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, as the current backlight device, there is a problem that the luminance variation will increase when it is used for large-scale equipment. Due to the characteristics of this equipment, in practice, the luminance uniformity on the object to be inspected is more required.

Method used

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Embodiment Construction

[0028] Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings.

[0029] figure 2 is an exploded perspective view showing the backlight device according to the first embodiment of the present invention. As shown in the figure, the backlight device 100 according to the present invention is installed on the inspection equipment for detecting defects on the object to be inspected, such as an LCD panel. , transmission and other light properties to detect defects on the object to be inspected, including a light source 110 for emitting light, a reflector 120 for reflecting light, and a brightness correction pattern 130 arranged on the reflector 120 .

[0030] The light source 110 may use a light-emitting diode (also called LED) with a long lifespan, or a cold cathode fluorescent lamp (also called CCFL) that emits less noise and heat, or a hot cathode fluorescent lamp (also called HCFL) that can achieve high brightness, or a As ...

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PUM

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Abstract

The invention provides a backlight device improving uniformity of brightness of a light irradiated on an object to be inspected by suppressing deviation of brightness. The backlight device comprises a light source irradiating a light on the object to be inspected, a reflection plate reflecting the light irradiated from the light source toward the object to be inspected, and a brightness correction pattern formed on the reflection plate, partially correcting light reflection amount of the reflection plate so that the brightness of the light irradiated on the object to be inspected becomes uniform. Since the light reflection amount of the reflection plate is partially corrected by the brightness correction pattern, brightness deviation of the light irradiated on the object to be inspected is minimized by the property and disposition of the light source, and excellent uniformity of the brightness can be obtained, even if the device require high brightness, heat generated in the light source can not resort in the interior, it can discharge effectively and distortion of the object to be inspected is minimized with the temperature, and capable of avoiding inaccurate effect occurrence.

Description

technical field [0001] The present invention relates to a backlight apparatus (Backlight Apparatus), in particular, relates to the correct detection of the object to be detected by improving the uniformity of brightness relative to the object to be detected, and preventing the Increased brightness deviation, damage to the object or peripheral components of the backlight device. Background technique [0002] Generally, equipment for detecting defects generated on a subject such as an LCD panel is provided with a backlight device as an important element so that by irradiating light to the subject, it is possible to utilize the The refraction, scattering, reflection, or transmission of the colliding light detects defects on a test object such as an LCD panel. [0003] A backlight device used in such a conventional inspection equipment such as an LCD panel will be described with reference to the drawings. [0004] figure 1 is an exploded perspective view showing a backlight d...

Claims

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Application Information

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IPC IPC(8): G02F1/13357G02F1/1335
CPCG02F1/133604G02F1/133606G02F1/133611G02F1/133628
Inventor 金泰秀
Owner PHICOM CORP
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