Method for testing storage by data compressing treatment

A technology of data compression and memory, which is applied in the direction of electrical digital data processing, static memory, instruments, etc., and can solve the problem of large memory application

Inactive Publication Date: 2007-02-28
INVENTEC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a method for testing memory through data compression processing. Since the compression process will repeatedly read and write an address in m

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  • Method for testing storage by data compressing treatment

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Embodiment Construction

[0020] In order to have a further understanding of the purpose, structure, features, and functions of the present invention, the following detailed descriptions are provided in conjunction with the embodiments. The above descriptions about the contents of the present invention and the following descriptions of the embodiments are used to demonstrate and explain the principles of the present invention, and provide further explanations of the claims of the present invention.

[0021] As shown in FIG. 1 , it is a flow chart of the method for testing memory through data compression processing in the present invention, using a compression algorithm, such as the Lempel-Ziv 77 (Lempel-Ziv 77; Lz77) algorithm, to carry out a pressure test on the memory.

[0022] First, the memory is divided into at least a starting memory block, a buffer memory block and a target memory block (step 110), wherein the size of the starting memory block and the target memory block are taken as the same, si...

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Abstract

The invention relates to a method for testing memory via compressing data, which uses compression algorism to test the memory, wherein it comprises: first dividing the memory into at least three blocks as initial memory block, buffer memory block and target memory block; then storing the sample data into initial memory block; using compression algorism to compress the sample data while the buffer data is stored in buffer memory block; storing the compressed sample data into target memory block; at last, decompressing the compressed sample data; compressing decompressed sample data with original compress data, to judge if the memory has mistake.

Description

technical field [0001] The invention relates to a method for testing memory, in particular to a method for testing memory through data compression processing. Background technique [0002] There are many algorithms for testing memory. The main purpose of these algorithms is to simulate the possible errors of the memory to show the possible errors of the memory in use when the machine is running. [0003] When the general test algorithm is running in a single thread, the load and pressure on the memory are insufficient, so it is impossible to test the errors that will occur when the memory is under high pressure. The usual algorithm is to write some specific sample programs into the memory. Then read out the verification. These algorithms do not perform repeated read and write tests on the memory, and the load on the memory is not high and the amount of calculation is small. In this way, when the single thread is running, the pressure on the memory and the central processing ...

Claims

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Application Information

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IPC IPC(8): G11C29/00G11C29/40G06F11/00
Inventor 张丁浩陈玄同刘文涵
Owner INVENTEC CORP
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