Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Method and apparatus for generating data for use in memory leak detection

a technology for detecting memory leaks and generating data, applied in the field of data processing systems, can solve problems such as bringing everything to a halt, claiming memory leaks, and consuming all of memory

Inactive Publication Date: 2005-05-26
IBM CORP
View PDF10 Cites 38 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

A memory leak is a condition caused by a program that does not free up the extra memory that the program allocates.
When memory is allocated for storing information that has no future use, but it continues to occupy memory, a memory leak is said to have occurred.
If too many memory leaks occur, these memory leaks may use up all of the memory and bring everything to a halt, or slow the processing considerably.
In Java, when objects are created in the memory and they continue to reside in the heap after their use, a memory leak can occur, especially if those objects do not have any future use.
Further, debugging memory leak problems using profilers in a software production environment is either impossible or impractical because it is a high risk proposition.
Debugging memory leaks using commercial profilers is a long and tedious process, requiring specialized skills.
Further, it is often not possible for a customer to reproduce problems in a test environment.
Generating heap dumps in a software production environment is an expensive process.
Further, it is often impossible to generate a heap dump because of resource restrictions in the production environment.
With the large size of a heap, a high risk of crashing a system, such as a Java virtual machine (JVM), is present when a heap dump is generated.
Further, once a heap dump is generated, the size of the log file is typically so large that interpretation of this data requires highly skilled experts.
Customers typically do not have the skill needed and many software production companies have very few people with the necessary skill.
As the time it takes to write the heap data to the log file is directly proportional to the amount of data to be written, there is little that a user can do to reduce the time it takes to write heap dump to a file.
Generating a heap dump may take several minutes and several heap dumps are typically needed to properly debug a problem involving memory leaks in a heap.
Consequently, it is difficult and tedious to debug memory leaks using currently available techniques.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and apparatus for generating data for use in memory leak detection
  • Method and apparatus for generating data for use in memory leak detection
  • Method and apparatus for generating data for use in memory leak detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] With reference now to the figures and in particular with reference to FIG. 1, a pictorial representation of a data processing system in which the present invention may be implemented is depicted in accordance with a preferred embodiment of the present invention. A computer 100 is depicted which includes system unit 102, video display terminal 104, keyboard 106, storage devices 108, which may include floppy drives and other types of permanent and removable storage media, and mouse 110. Additional input devices may be included with personal computer 100, such as, for example, a joystick, touchpad, touch screen, trackball, microphone, and the like. Computer 100 can be implemented using any suitable computer, such as an IBM eServer computer or IntelliStation computer, which are products of International Business Machines Corporation, located in Armonk, N.Y. Although the depicted representation shows a computer, other embodiments of the present invention may be implemented in othe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method, apparatus, and computer instructions for collecting data for analyzing memory leaks. A plurality of indicators are associated with a plurality of objects. The plurality of indicators are set to a first state. An indicator is set for each live object in the plurality of objects to a second state. In response to a request for the data, data is collected from all objects in the plurality of objects having indicators set to the first state.

Description

BACKGROUND OF THE INVENTION [0001] 1. Technical Field [0002] The present invention relates generally to an improved data processing system and in particular, a method and apparatus for processing data. Still more particularly, the present invention provides a method, apparatus, and computer instructions for generating data used in detecting memory leaks. [0003] 2. Description of Related Art [0004] In designing and creating programs, various tests and debugging procedures are performed to ensure that the programs are performing up to an expected level or standard. Debugging software is used to find the errors in the program logic. Different types of debugging may be performed on a program. One type of debugging that occurs in a software production environment involves debugging memory leaks. [0005] A memory leak is a condition caused by a program that does not free up the extra memory that the program allocates. In programming languages, such as C / C++, a programmer can dynamically al...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): G06F9/44G06F9/45
CPCG06F11/3636Y10S707/99957Y10S707/99953G06F11/366
Inventor BETANCOURT, MICHELPATEL, DIPAK MANHARBHAI
Owner IBM CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products