Probe station comprising a bellows with EMI shielding capabilities

Abstract

A probe station allows for effective EMI shielding of the passage of the probe through the wall of the housing of such probe station. The probe is freely movable in the X, Y and Z directions. The probe station comprises a housing having at least one aperture through which a probe can extend, a chuck for supporting a test device, the chuck being arranged inside the housing, at least one probe support for supporting a probe, the probe support being arranged relative to the housing such that a first portion of the probe extends into the housing through one of said apertures, at least one positioning mechanism enabling at least one of said probe and said chuck to move relative to the other, and is characterized in that at least one electrically conductive, elastic bellows is attached to the edge of an aperture which provides a variable passage for the probe.

Description

BACKGROUND OF THE INVENTION

[0001] The present invention relates to a probe station adapted for low current and low voltage measurements in testing semiconductor wafers or other electronic devices. More particularly, the invention relates to a probe station with EMI shielding capabilities.

[0002] EMI, as used herein, means electromagnetic interference, while EMC means electromagnetic compatibility, i.e. a state of a device wherein the device is neither a source of nor influenced by EMI.

[0003] Such probe stations, as described for example in U.S. Pat. No. 6,492,822 to Cascade Microtech, Inc., usually comprise a housing wherein a chuck for supporting a substrate, e.g. a semiconductor wafer, is installed. The chuck may be fixed relative to the housing or be supported movably by means of a first positioning mechanism.

[0004] The housing has at least one aperture through which a first portion of the probe or probes extend in order to make contact to the substrate for testing purposes su...

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