Physical unclonable function generation and management

a technology of function generation and management, applied in logic circuits, pulse techniques, reliability increasing modifications, etc., can solve problems such as process variations of integrated circuits that present a fundamental reliability challenge, process variability degrades the performance of measurement circuits, and inherent contradictions

Active Publication Date: 2014-11-06
GLOBALFOUNDRIES US INC
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  • Abstract
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Benefits of technology

[0007]One embodiment is directed to a circuit authentication system including a plurality of PUF elements and a measurement unit. The PUF elements include a first subset of PUF elements that are arranged in series and a second subset of PUF elements that are arranged in series, where the first subset of PUF elements is arranged in parallel with respect

Problems solved by technology

Process variations of integrated circuits present a fundamental reliability challenge with regard to generation and measurement of physical unclonable functions.
In particular, there is an inherent contradiction between forming a physical unclonable function (PUF) which depends on large variability and fabricating a reliable PUF measurement system which depends on low variability while integrating both functions monoli

Method used

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  • Physical unclonable function generation and management
  • Physical unclonable function generation and management
  • Physical unclonable function generation and management

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Embodiment Construction

[0026]As noted above, process variability leads to an inherent incertitude in measurement of PUF states. However, other factors also contribute to measurement error. For example, the temperature of circuit elements, noise, aging effects, radiation and supply voltage variations can lead to a drift in the PUF probability distribution function (PDF) and also to an expansion of the measurement error. For example, these additional factors can cause a drift of the PDF 102 in FIG. 1 to the right or left and can cause an expansion of the incertitude zone 202 in FIG. 2 to the right and / or to the left. Thus, these additional factors can decrease the effectiveness of on-chip PUF systems.

[0027]The exemplary embodiments described herein incorporate features that can mitigate the dependence of a PUF on temperature, noise, aging, radiation and / or supply voltage variations to provide a robust and reliable PUF scheme. For example, PUF variability can be reduced by employing a differential of PUF sta...

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Abstract

Methods, systems and devices related to authentication of chips using physical physical unclonable functions (PUFs) are disclosed. In accordance one such method, a test voltage is applied to a PUF system including a first subset of PUF elements that are arranged in series and a second subset of PUF elements that are arranged in series, where the first subset of PUF elements is arranged in parallel with respect to the second subset of PUF elements. In addition, the PUF system is measured to obtain at least one differential of states between the first subset of PUF elements and the second subset of PUF elements. Further, the method includes outputting an authentication sequence for the circuit that is based on the one or more differentials of states.

Description

RELATED APPLICATION DATA[0001]This application is a Continuation application of co-pending U.S. patent application Ser. No. 13 / 886,805 filed on May 3, 2013, incorporated herein by reference in its entirety.BACKGROUND[0002]1. Technical Field[0003]The present invention relates to physical unclonable functions, and more particularly, to on-chip physical unclonable function generation and management thereof.[0004]2. Description of the Related Art[0005]Process variations of integrated circuits present a fundamental reliability challenge with regard to generation and measurement of physical unclonable functions. In particular, there is an inherent contradiction between forming a physical unclonable function (PUF) which depends on large variability and fabricating a reliable PUF measurement system which depends on low variability while integrating both functions monolithically on the same chip. For example, although process variability maximizes the effectiveness of a PUF, process variabil...

Claims

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Application Information

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IPC IPC(8): H03K19/003
CPCH03K19/003
Inventor PFEIFFER, DIRKPLOUCHART, JEAN-OLIVIERSONG, PEILIN
Owner GLOBALFOUNDRIES US INC
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