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Semiconductor device and testing method thereof

A semiconductor and gray-scale voltage technology, which is applied in the field of semiconductor device and semiconductor device testing, can solve the problems of not being able to use the test machine and increase the test time, and achieve the effect of shortening the gray-scale voltage test time and reducing the cost of testing and manufacturing

Inactive Publication Date: 2008-08-27
RENESAS ELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

(2) When the determination range of the output voltage is very narrow due to the miniaturization of the grayscale voltage step due to the high grayscale of the liquid crystal display, it is necessary to subdivide the output terminal voltage of the liquid crystal drive circuit and the voltage of the tester. differential voltage between the reference voltages, which increases the test time
(3) In order to realize the technology described in Patent Document 1, it is necessary to newly add a grayscale voltage measurement circuit to the tester, and the existing tester cannot be used

Method used

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  • Semiconductor device and testing method thereof
  • Semiconductor device and testing method thereof
  • Semiconductor device and testing method thereof

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Embodiment Construction

[0021]

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In addition, in all the drawings for explaining the embodiments, members having the same functions are assigned the same reference numerals, and overlapping description thereof will be omitted.

[0022]

FIG. 1 shows an example of the structure of a semiconductor device including a liquid crystal drive circuit according to an embodiment of the present invention. In the configuration example of this semiconductor device, a gate driver 1 , a source driver 2 , a liquid crystal drive voltage generating circuit 3 , a liquid crystal panel 5 , an MPU 6 , and the like are provided.

[0023]

The gate driver 1 applies a gate signal to the liquid crystal panel 5 . The source driver 2 applies a grayscale output voltage to the liquid crystal panel 5 . The liquid crystal drive generation circuit 3 generates a drive voltage for the liquid crystal panel 5 . The liquid c...

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Abstract

A semiconductor device according to the present invention has a liquid crystal driver circuit, and when gray-scale voltage thereof is tested, the gray-scale voltage (Vx) generated in a gray-scale voltage generator circuit provided therein is compared with reference voltage (e.g., Vx+DeltaV) generated for testing the gray-scale voltage and the test result is output as binarized voltage from external terminals of the semiconductor device. This can speed up the gray-scale voltage test even in the case of higher gray scale in the liquid crystal driver circuit or increased number of output terminals of the semiconductor device. Therefore, it becomes possible to reduce the time and cost required for the test.

Description

technical field [0001] The present invention relates to a semiconductor device including a driving circuit for a liquid crystal display and a testing method thereof, and more particularly to a semiconductor device having a plurality of external terminals (output terminals) and a testing method for testing the output voltage thereof. Background technique [0002] A semiconductor device including a driving circuit for a liquid crystal display (liquid crystal driving circuit, also called an LCD driver) outputs multi-level (multi-gradation) voltages from a plurality of external terminals (output pins) to drive a liquid crystal display (liquid crystal panel). [0003] Conventionally, the grayscale voltage test of a semiconductor device including a liquid crystal drive circuit has been performed by voltage measurement (analog voltage measurement) using a tester. [0004] However, with the increase in the output terminals of semiconductor devices caused by the high precisio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R31/00G02F1/13
CPCG01R19/0038G01R19/0084G01R19/10G01R31/28G09G3/006G09G3/3674G09G3/3685G09G3/3696
Inventor 幕内雅巳中條德男今川健吾折桥律郎荒井祥智
Owner RENESAS ELECTRONICS CORP