Optical parameter absolute value measuring device and method thereof

Abstract

A measurer of optical parameter absolute value is featured as enabling both detector position and sample table to rotate around sample table center of circle, executing rotary angle by microprocessor CPU according to stepping motor controlled by command from external computer; utilizing air as reference, recording and calculating reflectivity absolute value when measurement is carried out.

Description

technical field [0001] The invention belongs to the technical field of analytical instruments, and in particular relates to an optical parameter absolute value measuring instrument and a measuring method thereof, in which both a sample stage and a detector can rotate around the center of the sample stage. Background technique [0002] When an object is illuminated by a light source, three situations occur: penetration, absorption, and reflection. Ordinary spectrophotometers can only measure the transmission of an object, also known as transmittance. Since the reflected light of the substance cannot be directly incident on the fixed detector vertically, a special measuring reflection accessory is required for the test. The usual measuring reflection accessories adopt the specular reflection principle: according to different reflection angles, multiple reflectors are combined together according to the requirements of the optical path principle, and the reflected light enterin...

AI Technical Summary

Problems solved by technology

This traditional measurement method after multiple reflections greatly attenuates the light energy reaching the detector, which affects many technical indicators of the instrument

Moreover, in order to meet the requirements of vertical incidence, it is required that the installation angles of multiple reflectors in the reflective accessories be accurate, which makes the structural design and installation and debugging of the instrument complicated.

In addition, the traditional reflection test needs to change the structure design of different incident angles when changing the reflection angle, and the installation and debugging become complicated

In addition, when changing the reflection angle, the traditional reflection test needs to replace the reflection accessories with different incident angles. To measure the reflectivity of a specific sample, a specific reflection accessory is required, which has poor flexibility and measures the relative reflectivity relative to a reference medium.

[0003] At home and abroad, there is no absolute value measuring instrument for optical parameters that can automatically measure the reflectivity and refractive index of samples at different incident angles and different wavelengths at high speed and high precision.

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