Optical parameter absolute value measuring device and method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SHANGHAI SPECTRUM INSTR
- Publication Date
- 2006-03-15
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of analytical instruments, and in particular relates to an optical parameter absolute value measuring instrument and a measuring method thereof, in which both a sample stage and a detector can rotate around the center of the sample stage. Background technique
[0002] When an object is illuminated by a light source, three situations occur: penetration, absorption, and reflection. Ordinary spectrophotometers can only measure the transmission of an object, also known as transmittance. Since the reflected light of the substance cannot be directly incident on the fixed detector vertically, a special measuring reflection accessory is required for the test. The usual measuring reflection accessories adopt the specular reflection principle: according to different reflection angles, multiple reflectors are combined together according to the requirements of the optical path principle, an...