Optical parameter absolute value measuring device and method thereof

An optical parameter and measuring instrument technology, applied in the field of analytical instruments, can solve problems such as poor flexibility, attenuation of light energy reaching the detector, instrument structure design, and complicated installation and debugging, and achieves improved photometric accuracy, easy instrument operation, and light energy. strong effect

Inactive Publication Date: 2006-03-15
SHANGHAI SPECTRUM INSTR
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Problems solved by technology

This traditional measurement method after multiple reflections greatly attenuates the light energy reaching the detector, which affects many technical indicators of the instrument
Moreover, in order to meet the requirements of vertical incidence, it is required that the installation angles of multiple reflectors in the reflective accessories be accurate, which makes the structural design and installation and debugging of the instrument complicated.
In addition, the traditional reflection test needs to change the structure design of different incident angles when changing the reflection angle, and the installation and debugging

Method used

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  • Optical parameter absolute value measuring device and method thereof
  • Optical parameter absolute value measuring device and method thereof
  • Optical parameter absolute value measuring device and method thereof

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[0021] from figure 1 It can be seen that the microprocessor CPU of the present invention accepts the instructions of the external computer and operates the rotation angle of the sample stage and the detection device, so as to obtain the best position for sample measurement. The measurement results of the detection device are converted by photoelectric conversion and V / F, and then returned to the computer through the microprocessor CPU for data processing.

[0022] figure 2 It is a schematic diagram of the structure of the whole machine of the present invention. As shown in the figure, the compound light of the light source in the lamp chamber 1 enters the monochromator 3 through the inlet slit 2, and is divided into monochromatic light through the outlet slit 4 and enters the sample chamber 6 through the lens barrel 5. , and then the sample to be tested 11 placed on the sample stage 9 enters the detector 12 for signal processing.

[0023] image 3 and Figure 4 It is a sc...

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Abstract

A measurer of optical parameter absolute value is featured as enabling both detector position and sample table to rotate around sample table center of circle, executing rotary angle by microprocessor CPU according to stepping motor controlled by command from external computer; utilizing air as reference, recording and calculating reflectivity absolute value when measurement is carried out.

Description

technical field [0001] The invention belongs to the technical field of analytical instruments, and in particular relates to an optical parameter absolute value measuring instrument and a measuring method thereof, in which both a sample stage and a detector can rotate around the center of the sample stage. Background technique [0002] When an object is illuminated by a light source, three situations occur: penetration, absorption, and reflection. Ordinary spectrophotometers can only measure the transmission of an object, also known as transmittance. Since the reflected light of the substance cannot be directly incident on the fixed detector vertically, a special measuring reflection accessory is required for the test. The usual measuring reflection accessories adopt the specular reflection principle: according to different reflection angles, multiple reflectors are combined together according to the requirements of the optical path principle, an...

Claims

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Application Information

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IPC IPC(8): G01N21/17G01N21/55
Inventor 陈建钢刘志高黄蕾边丽
Owner SHANGHAI SPECTRUM INSTR
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