Electronic component simulated fixture and power supply abnormity detection method

Abstract

The fixture has a second electric connection unit group corresponding to a first electric connection unit group, and respectively corresponding to the first, second and multi third electric connection units and having fourth, fifth and multi sixth electric connection unit. The method comprises: in the first, locating the fixture on the first electric connection group; using a voltage detector to read the voltage of the second electric connection unit group and fourth electric connection group of the fixture after powering on the circuit board; continuously comparing the voltage value read by the by voltage detector with the normal voltage value of the electronic component to decide if the power supply of the first electric connection unit is normal.

Description

technical field [0001] The present invention relates to a simulation fixture for electronic components and a power supply abnormality detection method, and more particularly, to a first electrical connection unit group for electrically connecting electronic components and a first electrical connection unit group for electrically connecting electronic components When connected to the first electrical connection unit group, a simulation jig for electronic components on a circuit board of a Voltage Regulator Module (VRM) that processes and adjusts the power required by the electronic components and a power supply abnormality detection method. Background technique [0002] In the testing process of the circuit board, taking the central processing unit (CPU) on the circuit board as an example, it must be set on the corresponding socket (socket) on the circuit board to perform the function test of the circuit board. [0003] However, in the above-mentioned functional test method o...

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Problems solved by technology

[0003] However, the functional testing method of the above-mentioned circuit board is often due to the poor electrical characteristics (such as failure or damage) of the electronic components on the circuit board that are electrically connected to the central processing unit, which will correspondingly lead to the supply of the central processing unit. The abnormal condition of the power supply of the circuit board will cause damage to the central processing unit. Undoubtedly, if the functional test of the circuit board is directly carried out with the physical components of the expensive central processing unit, unnecessary cost will be wasted.

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