Hartman wavefront sensor mass center measurement precision optimization method
A technology for measurement accuracy and optimization methods, which is applied in measurement devices, measurement optics, optical radiation measurement, etc., and can solve problems such as limited promotion and application, insufficient evidence, and no definite indicators
Inactive Publication Date: 2010-12-08
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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However, it does not compare the centroid algorithm of higher order moments, and the evidence for the conclusion is insufficient; more importantly, this conclusion is obtained intuitively through the graph formed by the data measured by a specific Hartmann wavefront sensor, and there is no certainty Indicators, which limit its promotion and application
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[0017] The built system platform meets the following conditions: the laser beam emitted by the standard parallel light source 1 is vertically incident on the Hartmann wavefront sensor, which ensures that the sub-aperture spot is in the paraxial region and avoids the influence of crosstalk errors.
[0018] Due to the influence of random noise, the photoelectric signal obtained by each pixel of the photodetector array is not completely equal to the actual light intensity of the spot. Usually, the threshold method is used to suppress the noise. The light source 1 is not working, and the signal output by each pixel is collected multiple times, and the average value of the (n, m) pixel signal is obtained to obtain the threshold value I' corresponding to the (n, m) pixel of the photodetector array 3 nm , where m=1...M, n=1...N is the pixel area corresponding to the sub-aperture mapped to the photosensitive target surface of CCD3.
[0019] When the standard parallel light source 1 wo...
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A method for optimizing centroid measurement precision of Hartmann wavefront sensor includes the steps of: performing threshold processing to pixel data outputted by photoelectric detector; calculating order moment centroid of each subaperture spot using the pixel data of threshold processing, wherein alpha=1, 2, 3......L; calculating repeatedly the order moment centroid of each subaperture spot;calculating the mean value of order moment centroid standard deviation of each subaperture spot; finding out the corresponding minimum order, namely finishing the method for optimizing centroid measurement precision of Hartmann wavefront sensor. Repeatedly calculating alpha order moment centroid of each subaperture spot and obtaining corresponding centroid standard deviation, thereby obtaining the excellent corresponding order which the mean value of all subaperture centroid standard deviation is small, and the filtered high-order centroid algorithm is capable of suppressing more effectively the influence of noise to centroid computational accuracy with the most excellent repeatable accuracy of centroid measurement relative to other each order moment centroid algorithm, thereby improving wavefront reconstruction accuracy.
Description
technical field [0001] The invention relates to a method for optimizing the measurement accuracy of the center of mass of a Hartmann wavefront sensor, in particular to the order selection of the center of mass algorithm for each order of moments. Background technique [0002] Hartmann wavefront sensors are widely used in the fields of atmospheric optics and optical detection because of their simple structure, high measurement accuracy, and low requirements for the measurement environment. The existing Hartmann wavefront sensor uses a microlens array to divide the beam aperture, and focuses the incident light to the photosensitive target surface of the photodetector (usually a CCD), or converts the focal plane spot pattern of the microlens to The image is imaged on the photosensitive target surface of the photodetector to obtain the spot array diagram according to the design requirements, and the centroid position of the sub-aperture spot can be obtained by performing the fir...
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IPC IPC(8): G01M11/02G01J9/00
Inventor 黄俊许冰李华强
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI