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Transient metal multiple adulterate negative temperature coefficient monocrystalline silicon thermistor

A technology of negative temperature coefficient and thermistor, which is applied to resistors with negative temperature coefficient, etc., can solve the problem of multiple doping of transition metal elements not involved, and achieve the effect of simple process

Inactive Publication Date: 2010-06-09
XINJIANG TECHN INST OF PHYSICS & CHEM CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these studies did not involve the study of multiple doping of transition metal elements

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] a. Use a P-type monocrystalline silicon wafer with a resistivity of 1Ωcm, and use 20-mesh corundum to smooth both sides, put the silicon wafer into deionized water and use ultrasonic cleaning to remove the sand, and then use ammonia water, hydrogen peroxide, and deionized water according to the Boil the lotion prepared in a ratio of 1:1:5 for 20 minutes, and then wash with hot and cold deionized water alternately for 3 times;

[0031] b. Dissolve 0.5 gram of manganese acetate and 0.005 gram of copper chloride in 20 milliliters of ethanol to form a solution as a diffusion source. The concentration in the diffusion source is: the concentration of manganese ions is 1×10 -4 mol / ml, copper ion concentration is 1.5×10 -5 mol / ml;

[0032] c. Apply the diffusion source evenly on the surface of the silicon wafer treated in step a, and bake it under an infrared lamp until the surface is dry;

[0033] d. Put the silicon wafer coated with the diffusion source into a high-temperat...

Embodiment 2

[0039] a. Use a P-type single crystal silicon wafer with a resistivity of 2Ωcm, and use 20-mesh corundum to smooth both sides, put the silicon wafer into deionized water and use ultrasonic cleaning to remove the sand, and then use ammonia water, hydrogen peroxide, and deionized water according to the Boil the lotion prepared in a ratio of 1:1:5 for 20 minutes, and then wash it alternately with hot and cold deionized water for 4 times;

[0040] b. Dissolve 0.5 gram of manganese acetate and 0.008 gram of copper chloride in 20 milliliters of ethanol to form a solution as a diffusion source. The concentration of the diffusion source is: the concentration of manganese ions is 1×10 -4mol / ml, copper ion concentration is 1.5×10 -6 mol / ml;

[0041] c. Apply the diffusion source evenly on the surface of the silicon wafer treated in step a, and bake it under an infrared lamp until the surface is dry;

[0042] d. Put the silicon wafer coated with the diffusion source into a high-tempera...

Embodiment 3

[0048] a. Use a P-type monocrystalline silicon wafer with a resistivity of 3Ωcm, and use 20 emery to smooth both sides, put the silicon wafer into deionized water and use ultrasonic cleaning to remove the sand, and then use ammonia water, hydrogen peroxide, and deionized water according to 1 : Boil the lotion made in the ratio of 1:5 for 20 minutes, then wash it 5 times with hot and cold deionized water;

[0049] b. Dissolve 0.5 gram of manganese acetate and 0.05 gram of copper chloride in 20 milliliters of ethanol to form a solution with a certain concentration as a diffusion source. The concentration of the diffusion source is: the concentration of manganese ions is 1×10 -4 mol / ml, copper ion concentration is 1.5×10 -5 mol / ml;

[0050] c. Apply the diffusion source evenly on the surface of the silicon wafer treated in step a, and bake it under an infrared lamp until the surface is dry;

[0051] d. Put the silicon wafer coated with the diffusion source into a high-temperatu...

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Abstract

This invention relates to a monocrystal silicon thermistor of negative temperature coefficient multiple-doped with transition metals, which applies a source-coat high temperature dispersion method totake transition metals Mn and Cu as doping agents into type P monocrystal silicon and utilizes the impurity compensation character of Mn and Cu in it to prepare low resistance thermistors of high ballstate and high B value, and the electricity parameter is 50- 1.2Kohm and material B value is 4100-4500K.

Description

technical field [0001] The invention relates to a negative temperature coefficient monocrystalline silicon thermistor with multiple transition metal doping. Background technique [0002] With the popularization and development of information technology and electrification, the amount and variety of thermistors will increase significantly, especially some high B value and low resistance thermistor components and sensors will become the products in short supply in this industry. Over the years, in order to improve the grade of components and meet the market demand for high B value and low resistance special components, people have adopted technologies such as doping rare earth elements in oxide materials and adopting multi-layer parallel structure in component manufacturing, but so far no Get satisfactory results. Silicon single crystal thermistors have more advantages and competitiveness than oxide thermistors in terms of sensitivity, production efficiency and manufacturing ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01C7/04
Inventor 陈朝阳范艳伟丛秀云
Owner XINJIANG TECHN INST OF PHYSICS & CHEM CHINESE ACAD OF SCI