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X ray checking device

A technology for line inspection and generation of devices, applied in the direction of material analysis using radiation, etc.

Inactive Publication Date: 2011-09-14
SHIMADZU SEISAKUSHO CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0020] In this way, there are two opposite problems of improving the image quality and tracking the movement of the field of view, and it is difficult to solve the above two problems at the same time

Method used

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Embodiment Construction

[0080] Hereinafter, embodiments of the present invention will be described using drawings. In addition, this invention is not limited to embodiment as demonstrated below, Various aspects can be included in the range which does not deviate from the summary of this invention.

[0081] (Embodiment 1)

[0082] figure 1 It is a block diagram showing the configuration of an X-ray inspection apparatus as an embodiment of the present invention. The X-ray inspection device 1 includes: an X-ray measurement optical system 13, including an X-ray generating device 11 and an X-ray detector 12; a field of view adjustment mechanism 14, which adjusts the measurement field of view of the object to be measured; and a control system 15, which controls the entire device. control.

[0083] The control system 15 includes a general-purpose computer device, and its hardware is further described modularly below: including a CPU 21, input devices 22 such as a keyboard and a mouse, display devices 23...

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PUM

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Abstract

An X-ray checking device can solve two reverse problems of the improvement on video quality and the traceability of visual field moving and has better usability. The X-ray checking device includes a frame image data preparing department which detects an image signal shot by an X-ray detector of an X-ray optical system according to the X-ray and repeatedly makes the frame image data of an X-ray perspective image by taking 1 frame as a unit; a fine image data preparing department which stores the image data used for preparing the fine image data in an image buffer storage and uses the stored image data and the latest frame image data of the X-ray perspective image so as to make the fine image data; a display device for displaying the image data; a visual field adjusting department for adjusting the position relation between an object to be detected and the X-ray optical detecting system to lead a detecting visual field corresponding to the object to be detected to be altered; a visual field alternation detecting department for judging whether the detecting visual field is altered; and an image mode switching department for displaying the frame image data when the visual field is judged to be altered and displaying the fine image data when the visual field is judged to be fixed.

Description

technical field [0001] The present invention is an X-ray inspection device, which is used for fluoroscopy or CT inspection of industrial products and the like. Background technique [0002] In an X-ray inspection device for fluoroscopy inspection of industrial products, etc., an X-ray detector is arranged facing the X-ray source of the X-ray generator, and an image intensifier (hereinafter referred to as II) and a CCD are combined. Recently, an X-ray inspection apparatus using a flat X-ray detector is also used instead of the X-ray detector including II and CCD cameras. [0003] In the above-mentioned X-ray inspection device, a platform is disposed between the X-ray source and the X-ray detector, and the object to be measured is placed on the platform to take an X-ray fluoroscopic image. [0004] Generally, in an inspection performed by an X-ray inspection apparatus, a field of view is moved for aligning a position, adjusting a measurement magnification, and adjusting a mea...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04
Inventor 立泽嘉浩
Owner SHIMADZU SEISAKUSHO CO LTD