Method and device for precision positioning and testing contact resistance

Abstract

The invention discloses a precision positioning contact resistance testing method and a device. The device comprises a precision positioning unit, a motion control unit, a contact resistance test unit, a computer control platform unit and a feedback unit. The parameter of the plane distance between the surface intersection point of a standard sample block and the contact spot of a test sample wafer is determined in advance, the computer control platform sends a positioning command, the motion control unit receives and feeds back the positioning command and converts the command into a control voltage command output to control the precision positioning unit, and the feedback unit feeds back the distance information of the precision positioning unit to the motion control unit; then the computer control platform unit sends a contact pressure command and a test command, and the contact resistance test unit begins the contact resistance test, thereby realizing the precision positioning and repositioning of the contact spot in a contact area and also realizing automatic continuous test of the contact resistance under the multipoint and multi-contact-pressure condition.

Description

technical field [0001] The invention relates to precise positioning testing technology, in particular to a method and device for precise positioning testing contact resistance. Background technique [0002] There are a large number of electronic connectors in communication, computer, measurement, control and various electronic systems, which play a role in maintaining various electronic components, circuits, devices and systems. When these electronic connectors are in poor contact, it will cause a series of system failures such as interruption of the corresponding communication system, computer error code, failure of the control system, distortion of transmitted images and data, etc. Therefore, the reliability of the system operation and the contact resistance of the electronic connection have a close connection. Contact resistance is related to the size, shape, number and distribution of contact spots at electronic connections, among which, contact spots are related to the...

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Problems solved by technology

[0004] However, this contact resistance test device needs to manually move the test contacts to a specific tiny area (that is, the contact area) containing pollutants on the test sample, so the contact area of ​​the test may deviate from the actual contact pollution area, and cannot be used for electronic connectors. The contact position of the contact contact is precisely controlled, resulting in a low test contact resistance value, which cannot truly reflect the state of the contact area

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