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Module testing method and system

A technology of module testing and testing time, applied in electronic circuit testing, digital circuit testing, detecting faulty computer hardware, etc., can solve the problems of low testing efficiency, waste of testing cost, poor flexibility, etc., to save testing cost and improve The effect of testing efficiency

Active Publication Date: 2010-06-02
ZTE CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Moreover, the module test using the existing technology cannot effectively monitor the test process. If the module test cannot be carried out normally due to abnormal test and other reasons, it can only wait for the tester to find out and deal with it accordingly. Check the test running status, so the existing module test method has poor flexibility, low test efficiency, and waste of test cost

Method used

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  • Module testing method and system
  • Module testing method and system

Examples

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Embodiment Construction

[0028] The basic idea of ​​the present invention is: record the test time of the script in the module during the module test process, and monitor the test running situation of the module according to the standard test time of the script in the module, if the monitoring finds that the test running situation of the module is abnormal, then Automatically execute the pre-set corresponding processing strategies. The present invention will be described in further detail below in conjunction with specific embodiments, ie, accompanying drawings.

[0029] figure 1 Be the module test method flowchart of the present invention, as figure 1 Shown, module test method of the present invention comprises the following steps:

[0030] Step 101: The test execution unit obtains the information of the modules to be tested.

[0031] Here, testers can set the module test order in the time statistics unit according to actual needs. For example, when the test time is limited, the module tests can b...

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Abstract

The invention discloses a module test process comprising obtaining testing module information and beginning to test module script, if the test for module script being completed within test time thresholding, modifying the standard test time of the script and testing the next script, otherwise, inquiring and executing corresponding handling policy, when all scripts in the module are tested, modifying the standard test time of the module and testing the next module. The invention also discloses a module test system. In the method and system, the test condition can be monitored in test process according to the standard test time of the script in the module, and test order of the module can be adjusted according to actual need. The module test method and system improves the test efficiency andsaves test cost.

Description

technical field [0001] The invention relates to module testing technology, in particular to a module testing method and system. Background technique [0002] In recent years, electronic products have more and more functions, and the modules that make up electronic products are also gradually diversified. In order to improve the quality and user experience of electronic products, it is necessary to test the different modules that make up electronic products. [0003] The test time required by different modules varies from a few minutes to tens of hours. Since the time required for the module test cannot be known, the test sequence of the modules is determined arbitrarily during the test process. However, in the case of short test time, if the first few modules that need to be tested take a long time, it is easy to cause low test efficiency or even test failure due to insufficient time. For example, the test time is 2 hours, but the test time for the first module to be tested...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22G01R31/317
Inventor 郇昌波李素林樊志强刘宗昌刘凤萍
Owner ZTE CORP
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