Method for choosing exposure parameter by using X ray exposure equation
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- 陕西化建工程有限责任公司
- Publication Date
- 2008-10-29
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1
Abstract
Description
1. Technical field:
[0001] The invention relates to a pipeline X-ray flaw detection method, in particular to a method for selecting exposure parameters by using an X-ray exposure equation. 2. Background technology:
[0002] In the background technology, X-ray flaw detection is performed on the girth weld of small-diameter pipes, and the exposure parameters selected by using the exposure curve have large errors due to various reasons. Generally, the nominal diameter of the pipe is D e ≤100mm pipes are called small diameter pipes. The X-ray exposure curve made by the ladder test block is used for X-ray flaw detection of small diameter pipe girth welds. When selecting exposure parameters, due to the difference between the plane and the arc surface, the actual transillumination thickness value changes continuously, and the actual transillumination thickness ratio is large Due to the large thickness ratio between the weld zone and the base metal zone, the selection of the trans...