Methods, systems, and computer program products for measuring the density of material
A technology for measuring meters and densities, applied in measuring devices, using wave/particle radiation, instruments, etc., can solve problems such as disrupting the construction process and delays
Active Publication Date: 2008-10-29
TROXLER ELECTRONICS LAB INC
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Problems solved by technology
Another difficulty with using nucleometry is the time required to make material density measurements
Delays in obtaining density measurements of the soil during construction may delay or otherwise disrupt the construction process
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Abstract
Methods, systems, and computer program products for measuring the density of material. According to one aspect, a nuclear density gauge is disclosed for measuring the density of a sample construction material. The gauge includes a radiation source positioned in an interior of a sample construction material and adapted to emit radiation from the interior of the sample construction material. Further, a radiation detector is positioned apart from the radiation source. The radiation detector is operable to produce a signal representing an energy level of detected radiation. A material property calculation function is configured to calculate a value associated with the density of the sample construction material based upon the signal produced by the radiation detector. Further, the radiation source may be positioned on a surface of the sample construction material and adapted to emit radiation towards the surface of the sample construction material.
Description
Method, system and computer program product for measuring density of material Cross References to Related Applications This application claims the benefit of U.S. Provisional Patent Application No. 60 / 712754, filed August 30, 2005, and U.S. Provisional Patent Application No. 60 / 719071, filed September 21, 2005, which are hereby incorporated by reference in their entirety public. Hereby, reference is made to concurrently filed U.S. Patent Application No. xx / xxxxxx entitled "METHODS, SYSTEMS, ANDCOMPUTER PROGRAM PRODUCTS FORMEASURING THEDENSITY OF MATERIAL" and U.S. Patent Application No. xx / xxxxxx entitled "METHODS, SYSTEMS, ANDCOMPUTER PROGRAM PRODUCTS FORMEASURING THEDENSITY OF MATERIAL" in their entirety. public. technical field The subject matter described herein relates to measuring material properties. In particular, the subject matter described herein relates to methods, systems, and computer program products for measuring the density of materials. Background tec...
Claims
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IPC IPC(8): G01B15/02
Inventor R·E·特克斯勒W·H·L·德普
Owner TROXLER ELECTRONICS LAB INC
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