Test device and test method of rapid response electronic device response speed

Abstract

The invention discloses a device for testing the response speed of quick response electronic devices and a testing method thereof. The device for testing the response speed of the invention comprises a power control circuit, at least two response modules of the electronic devices to be tested and a timer; the power control circuit is electrically connected with the power source end of the response modules; all modules are connected in series; the startup trigger signal of the timer synchronizes the trigger signal of the first response module; the shutoff trigger signal of the timer synchronizes the output signal of the last response module. The testing device and the testing method of the invention aim at overcoming the defects of the high cost and low measurement precision of the testing the response speed of the quick response electronic devices, measure the total response time by connecting a plurality of devices to be tested in series, obtain the response time of each group of devices by calculation, require no application of the display instruments of high cost and can obtain a high-precision testing result of electronic devices of the same type at the same time.

Description

technical field [0001] The invention relates to a test device and a test method thereof, in particular to a device for testing the response speed of fast-response electronic devices and a test method thereof. Background technique [0002] In recent years, with the rapid development of electronic devices such as semiconductors, the performance and response speed of various electronic devices have been greatly improved. Correspondingly, the device performance testing equipment is also developing rapidly. At present, the response speed of various fast-response electronic devices, such as high-performance photocoupler devices, has reached the nanometer level, and the test accuracy of the test equipment is far from meeting the requirements. The test work is only the result of rough tests, or Testing with expensive equipment costs a lot of money, and the cost is too high. [0003] In addition, organic electroluminescent displays (OLEDs), which have emerged in recent years, have a...

AI Technical Summary

Problems solved by technology

[0006] 1. Because the response time of the OLED screen is very short, a high-speed oscilloscope is required to observe the waveform, and the instrument cost is high;

[0007] 2. Such a fast waveform is fleeting on the oscilloscope, which cannot be carefully observed and studied, which affects the measurement accuracy;

[0008] 3. The response speed of the photoelectric sensing element, the time delay of the amplification and shaping circuit cannot be determined, and these factors will overwhelm or greatly affect the response speed of the OLED screen

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