Double monocular white light three-dimensional measuring systems calibration method

A calibration method and three-dimensional measurement technology, which can be used in measurement devices, diagnostic recording/measurement, and optical devices, etc., can solve problems such as inconvenience in calibration, unsuitability for dual-monocular three-dimensional measurement systems, increase in external volume and production costs, etc.

Inactive Publication Date: 2010-06-23
三的部落(上海)科技股份有限公司
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition, this method requires the projector to project an additional calibration pattern, which will increase its overall size and production cost for a slide projector
Xiaobo Chen proposed a monocular measurement head using a digital projector in the paper Accuratecalibration for a camera-projector measurement system based on structured lightprojection (Optics and Lasers in Engineering, 2008, doi: 10.1016 / j.optlaseng.2007.12.001) The parameter calibration method, but this method is not suitable for the dual-monocular three-dimensional measurement system using a slide projector, and this method has high requirements for reference calibration objects, which brings inconvenience to calibration

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Double monocular white light three-dimensional measuring systems calibration method
  • Double monocular white light three-dimensional measuring systems calibration method
  • Double monocular white light three-dimensional measuring systems calibration method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] The specific implementation of the present invention will be further described below in conjunction with the accompanying drawings.

[0046] Such as image 3 As shown, the measurement system calibrated by the method of the present invention is a dual-monocular white light three-dimensional measurement system for repairing facial defects of patients. The measurement system includes a left monocular measuring head 1 , a right monocular measuring head 2 , a measuring head support 3 , a measuring head translation mechanism 4 , a control cabinet 5 and a computer 6 . Wherein the left monocular measuring head 1 includes a left slide projector 7 and a left camera 8 , and the right monocular measuring head 2 includes a right slide projector 9 and a right camera 10 . The left slide projector 7 and the right slide projector 9 are placed above the left camera 8 and the right camera 10 respectively.

[0047] Such as figure 1 , figure 2 As shown, the specific implementation step...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Disclosed is a calibration method for parameters of a double monocular white light three-dimensional measurement system, which belongs to the field of optical measurement and mechanical engineering. The method adopts a plane calibration board as a known calibration object positioned in the measuring range of the system, and obtains the corresponding projection pixel point of a calibration spot ina left camera and the absolute phase value through processing a structured light fringe image on the calibration board projected by a left slide projector and taken by the left camera, and the corresponding projection pixel point of a calibration spot in a right camera and the absolute phase value through processing the structured light fringe image on the calibration board projected by a right slide projector and taken by the right camera. The method goes on linear calibration to a left and a right single measuring head according to the basic data calibrated by the system to obtain as much initial value of parameters of the measurement system as possible and overall nonlinear optimized calibration to the measurement system based on the linear calibration to obtain the optimized value of all the parameters of the measurement system, thereby realizing the precise calibration of parameters of the double monocular white light three-dimensional measurement system.

Description

Technical field: [0001] The invention relates to a calibration method for a three-dimensional measurement system, in particular to a calibration method for parameters of a dual-monocular white light three-dimensional measurement system using a slide projector. It belongs to the technical fields of optical measurement and mechanical engineering. Background technique: [0002] The traditional camera calibration method is to obtain the calibration basic data by taking a calibration reference object of known size and processing the captured image, so as to realize the calibration of the camera parameters. The basic data of camera calibration establishes the correspondence between the measured coordinate system coordinates of known calibration points and the projected pixel coordinates of calibration points acquired by camera image processing; the traditional calibration method of projectors is to project a calibration pattern of known size, and The coordinates of the calibratio...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/03G01B11/24A61B5/107
Inventor 习俊通陈晓波熊耀阳张富强
Owner 三的部落(上海)科技股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products