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Quarter-wave plate fast axis direction real-time measurement apparatus and method

A technology of real-time measurement and wave plate, which is applied in the field of real-time measurement device for quarter wave plate fast axis azimuth, can solve the problems of complex structure of the device, high requirements for measurement accuracy, light source stability, and inability to realize real-time measurement, etc., to achieve structural simple effect

Inactive Publication Date: 2008-12-10
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

Due to the need to rotate the measured quarter-wave plate and polarizer multiple times, this device cannot achieve real-time measurement of the fast axis orientation. Its measurement accuracy is affected by light intensity fluctuations and requires high stability of the light source, requiring precise rotation. The mechanism makes the structure of the device complex

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  • Quarter-wave plate fast axis direction real-time measurement apparatus and method
  • Quarter-wave plate fast axis direction real-time measurement apparatus and method
  • Quarter-wave plate fast axis direction real-time measurement apparatus and method

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Embodiment Construction

[0032] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.

[0033] see first figure 1 , figure 1 It is a structural block diagram of an embodiment of the quarter-wave plate fast-axis orientation real-time measurement device of the present invention. As can be seen from the figure, the quarter-wave plate fast axis orientation real-time measuring device of the present invention is composed of a collimated light source 1, a polarizer 2, a standard quarter-wave plate 3, a diffractive beam splitting element 5, and a focusing lens 6 , an analyzer array 7, a photodetector array 8, an amplifying circuit 9 and a signal processing system 10, and its positional relationship is: along the forward direction of the beam of the collimated light source 1, followed by the polarizer 2. Standard quarter wave plate 3, diffractive beam splitting eleme...

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Abstract

The invention relates to a real time measuring device and a method thereof for the orientation of a fast axis of a quarter wave plate. The device consists of a collimated light source, a polarizer, a standard quarter wave plate, a diffraction light splitting element, a focusing lens, a polaroid analyzer array, a photodetector array, an amplifying circuit and a signal processing system. The measuring method includes as follows: the parallel light beams exited by the collimated light source after passing through the polarizer and the standard quarter wave plate form a circularly polarized light; the circularly polarized light after passing through the quarter wave plate to be detected is split by the diffraction light splitting element; a plurality of sub-light beams with equal intensity are focused on the polaroid analyzer array by the focusing lens to respectively generate polarization interference for forming interference light intensities with a certain displacement in turn which are received by the photodetector array; a telecommunication signal outputted by the photodetector array after passing through the amplifying circuit is processed by the signal processing system, thus being capable of obtaining the orientation angle of the fast axis of the quarter wave plate to be detected in real time.

Description

technical field [0001] The invention relates to the field of polarization measurement, in particular to a device and method for real-time measurement of the fast axis orientation of a quarter-wave plate. Background technique [0002] Quarter-wave plate is a commonly used polarizing optical element, which is widely used in modern optical measurement technology and polarized light application technology and other fields. The fast-axis orientation is one of the important optical parameters of the quarter-wave plate. Usually, the fast-axis orientation of the quarter-wave plate is not marked, and it is necessary to accurately measure the quarter-wave plate’s The orientation of the fast axis and make adjustments based on this. [0003] The prior art [1] (refer to Wang Wei, Li Guohua, Wu Fuquan, etc. A new method for measuring wave plate retardation and fast axis orientation. China Laser, Vol.30, 1121-1123, 2003) describes a method that can measure four One-third wave plate fast ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G01J4/00
Inventor 曾爱军杨坤郭小娴谢承科黄惠杰王向朝
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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