Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Ultra-wideband non-coherent system average bit error rate estimating method under S-V modified model fading channel of IEEE802.15.3a

A technology of average bit error rate and correction model, which is applied in transmission system, transmission monitoring, electrical components, etc., can solve problems such as difficult receiver analysis, ultra-wideband dense multipath channel complexity, many random variables, etc., and achieve the goal of simplifying evaluation The effect of the process

Active Publication Date: 2012-10-10
HARBIN INST OF TECH SHENZHEN GRADUATE SCHOOL
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The average bit error rate is a commonly used performance index for evaluating receivers in wireless fading channels. However, there are few in-depth studies on this performance index for ultra-wideband receivers, mainly due to the complex characteristics of ultra-wideband dense multipath channels. Paths appear in clusters, and the receiver needs to process many random variables at the same time because of energy collection, so it is difficult to accurately analyze the above two performance indicators of the receiver in a fading channel
Some existing studies have analyzed the performance of RAKE receivers, but the mathematical calculations are complex, and the calculation process requires the use of numerical integration methods to approximate the results
No studies have analyzed the performance of non-coherent UWB receivers in this aspect

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ultra-wideband non-coherent system average bit error rate estimating method under S-V modified model fading channel of IEEE802.15.3a
  • Ultra-wideband non-coherent system average bit error rate estimating method under S-V modified model fading channel of IEEE802.15.3a
  • Ultra-wideband non-coherent system average bit error rate estimating method under S-V modified model fading channel of IEEE802.15.3a

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The following content is a further detailed description of the present invention in conjunction with specific preferred embodiments, and it cannot be assumed that the specific implementation of the present invention is limited to these descriptions. For those of ordinary skill in the technical field of the present invention, without departing from the concept of the present invention, some simple deduction or replacement can be made, which should be regarded as belonging to the protection scope of the present invention.

[0032] The structure of the receiver aimed at by the evaluation method of the average bit error rate of the ultra-wideband non-coherent system of the present invention under the S-V correction model fading channel of IEEE 802.15.3a is as follows figure 1 As shown, its working process is: first, the signal passes through the square law detector, and then enters the interval integrator. The choice of modulation mode can be obtained by processing the inte...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an evaluation method of the average bit error rate for an ultra wideband incoherent system under an S-V modified model fading channel of IEEE 802.15.3a, including the following steps: S1: the expression of average values of channel energy and variance for a given channel model and a parameter is solved; S2: the channel energy is fitted into a logarithmic normal distributionmodel; S3: the result of fitted model is compared with an actually generated channel parameter; S4: the conditional bit error rate when the signal is under the condition of an additive white Gaussiannoise channel is solved; S5: a set of random numbers subject to logarithmic normal distribution are randomly generated according to the parameters of the average values and the variances, and the generated random numbers are used for substituting the energy per bit in the expression of bit error rate, thus obtaining a set of bit error rate values; and S6: the average bit error rate is solved according to the set of bit error rate values.

Description

technical field [0001] The invention relates to the field of wireless ultra-wideband communication receivers, in particular to an evaluation method for the average bit error rate of an ultra-wideband non-coherent system under the fading channel of the S-V correction model of IEEE 802.15.3a. Background technique [0002] Due to its advantages of small size, low power, and low cost, pulsed UWB technology has attracted widespread attention in low-speed communications, such as sensor networks, target positioning, and identification systems. The low-complexity receiver design is the key issue for the wide application and development of UWB technology. At present, researches on UWB receivers mainly focus on three schemes: coherent-based RAKE receivers and non-coherent-based TR receivers and ED receivers. The performance of the RAKE receiver is better than the other two through the coherent diversity reception of the multipath energy of the ultra-wideband signal, but for the syste...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04B1/7115H04B17/00H04B1/7163H04B17/391
Inventor 张钦宇王野杨志华张霆廷
Owner HARBIN INST OF TECH SHENZHEN GRADUATE SCHOOL
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products