Wafer and method for verifying and defect and scanning machine
A defect scanning and wafer technology, applied in the direction of optical testing defects/defects, etc., can solve the problems of difficult frequent use, high cost of standard chips, etc.
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[0012] In order to solve the problem of the high cost of the standard chip and the difficulty of frequent use, the embodiment of the present invention provides a method and chip for verifying the defect scanning machine. The method is to self-made and regularly test the QC chip without using the standard chip. , Used to verify the machine. The embodiment of the present invention adopts the following method. Use standard chips to verify the accuracy of the machine before the test, and then select the appropriate QC wafers, and record the particle distribution, particle size and quantity after scanning on the machine. In order to fix the existing particles of the QC wafer, a layer of SiN film is grown on the surface of the QC wafer, so that the particles on the surface of the original QC wafer are wrapped by the SiN film and will not change with time. The QC wafer covered with the SiN film is measured on the machine again. At this time, the distribution, size, and quantity of the pa...
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