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Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non-static object

A technology of three-dimensional images and objects, which is applied in measuring devices, distance measurement, line-of-sight measurement, etc., and can solve problems such as inability to measure, moving objects or difficult installation of measurement systems

Active Publication Date: 2011-04-20
FUKUOKA INSTITUTE OF TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0018] As described above, in the method of Patent Document 1, it is difficult to cope with the installation of the moving object or the measurement system, and in the method of Patent Document 3, when the moving speed of the moving object is not uniform or when the moving direction is uncertain , there is a problem of not being able to measure

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  • Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non-static object
  • Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non-static object
  • Three-dimensional image measurement apparatus, three-dimensional image measurement method, and three-dimensional image measurement program of non-static object

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Embodiment 1

[0109] Then, as a first embodiment, in Figure 10 The results of three-dimensional image measurements performed on a phantom of a rabbit as a non-stationary object are shown in . Figure 10 It is a diagram showing how a three-dimensional image measurement is performed on a model of a moving rabbit using the three-dimensional image measuring device in this embodiment, (a) is a diagram showing a global illumination reflection image captured by projecting global illumination light, ( b) is a diagram showing an intensity modulation pattern that is an optimal intensity combination pattern, (c) is a diagram showing a reflection pattern image captured by projecting an intensity modulation pattern, and (d) is a diagram showing global illumination reflection after adjustment Of the images, (e) is a diagram showing a reflection pattern image after intensity value correction, and (f) is a diagram showing images graphically visualized from various angles based on measured three-dimensiona...

Embodiment 2

[0112] Next, as a second example, the result of three-dimensional image measurement using a color modulation pattern will be described. Figure 11 It is an image diagram of an example of a color modulation pattern and an example of a reflection pattern image, (a) is a diagram showing an example of a color modulation pattern, (b) is a diagram showing a color reflection pattern image reflected from an object to be measured, (c) is a diagram showing the corrected reflection pattern image, and (d) is a diagram showing the positions of individual patterns and stripes of the reflection pattern in the xy chromaticity diagram. in addition, Figure 11 In (a), the color modulation patterns (addresses 1 to 7) are displayed on a gray scale, but the color modulation patterns (addresses 1 to 7) are the individual patterns of red 101, the individual patterns of green 102, and the individual patterns of yellow in order from the top. 103 , a striped projected figure formed by individual figur...

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Abstract

A three-dimensional image measurement apparatus of a non-static object is composed of a pattern projector (1) which projects pattern light onto an object (A) to be measured, a camera (2) which images the object (A) subjected to projection of the pattern light to capture the image, and a data processor (3) which processes data on the image captured by the camera (2). Light of a pattern for the whole surface projection and intensity-modulated pattern light are projected onto the object (A) to capture the image by the pattern projector (1) and the camera (2). With a captured full-illumination reflected image and a reflected pattern image, the movement state of the object (A) is estimated, and the full-illumination reflected image or the reflected pattern image is adjusted. Thereafter, the intensity value of the reflected pattern image is corrected. From the intensity value of the corrected reflected pattern image, the projection direction angle of individual pattern light forming projected pattern light is calculated, and a depth distance is calculated. Thus, precise three-dimensional information can be obtained without contacting.

Description

technical field [0001] The present invention relates to a three-dimensional image measurement device, a three-dimensional image measurement method, and a three-dimensional image measurement program that project predetermined pattern light on a non-stationary object and measure three-dimensional information without contact. Background technique [0002] In recent years, in various fields such as quality management, safety precautions, and safety management, in production lines or production sites, it is required to measure the shape of non-stationary products or the measurement of their spatial positions, or to obtain moving or non-stationary objects. Three-dimensional shape data such as the face, body, hands and feet of the human body, the development of a non-contact and high-speed three-dimensional measuring device for these non-stationary objects is expected. [0003] Conventionally, the principle of triangulation is widely used in three-dimensional image measurement. Fi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25G01C3/06
CPCG01B11/2545G01B11/245G01C3/06
Inventor 卢存伟长元气
Owner FUKUOKA INSTITUTE OF TECHNOLOGY