Method for analysing analog circuit fault propagation characteristic

Abstract

The invention discloses a method for analyzing analog circuit fault propagation characteristics, comprising the following steps of: acquiring circuit response curve clusters under the condition that each analog circuit node is normal and circuit response curve clusters under the node fault state; dividing the fault mode according to the matched degree of the circuit response curve clusters under the node fault state and the circuit response curve clusters under the normal condition; constructing an analog circuit fault propagation network according to the fault mode; calculating the clustering coefficient C and average characteristic path length of the analog circuit fault propagation network; and calculating the degree distribution of the analog circuit fault propagation network and then selecting measurable points according to the degree distribution. The invention carries out preference on the measurable points of a fault circuit according to the scale-free network characteristic and the non-uniformity characteristic which are showed by the circuit fault propagation characteristics, thereby further increasing the fault diagnosis efficiency and accuracy degree.

Description

technical field [0001] The invention relates to an analysis method for fault propagation characteristics of a simulated circuit. Background technique [0002] One of the most concerned tasks in fault diagnosis of analog circuits is fault location. How to use fault information more efficiently and search for fault locations more accurately is the goal it is constantly pursuing. However, the characteristics of analog circuits, such as component tolerance, continuity of response, limited accessible nodes and nonlinearity, high order, and multiple loops of the circuit, make the faults show hierarchy, propagation, and correlation. A tiny The propagation, diffusion, accumulation and amplification of fault signals through the circuit topology will seriously affect the reliability and safety of the circuit. On the one hand, these abnormal information is an important information source for fault diagnosis, and on the other hand, it will also have a negative impact on the location of...

AI Technical Summary

Problems solved by technology

[0003] Among the many simulation and feature extraction methods for analog circuit faults, due to the lack of highly automated simulation methods, it is difficult to process the huge sample data of fault characteristics and dig out many statistical characteristics of the sample data itself, resulting in many Lack of available diagnostic information

Images