Manufacturing method of monolithic integrated pressure sensor
A technology of pressure sensor and monolithic integration, which is applied in semiconductor/solid-state device manufacturing, measurement of the property and force of applied piezoresistive materials, electrical components, etc., and can solve compatibility difficulties, monolithic integration difficulties, and easy-to-contaminate IC processes, etc. problem, to achieve the effect of solving the compatibility of processing technology
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[0064] Specific embodiments of the present invention are not limited to the following description. The present invention will be further described now in conjunction with accompanying drawing.
[0065] The main steps of the inventive method are as follows:
[0066] 1. On the P-type silicon substrate sheet 2, the steps of making the P-type silicon substrate that bipolar analog integrated circuits and varistors are used are as follows:
[0067] (1) P-type silicon substrate 2, with crystal orientation, polished on both sides, with a thickness of 400±10 μm and a resistivity of 7-13Ω·cm, cleaned and oxidized, and the thickness of the oxide layer 1 is 0.6±0.05 μm, such as figure 1 shown;
[0068] (2) photoetching N+ buried layer region 3;
[0069] (3) Adhesive arsenic injection, dose 6E15 / cm 2 , energy 100keV, glue removal;
[0070] (4) photoetching P+buried layer region 4;
[0071] (5) Boron injection with glue, dose 1E15 / cm 2 , energy 60keV, glue removal;
[0072] (6) Usi...
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