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Test method of light emitting diode of storage device and test tool thereof

A technology of light-emitting diodes and storage devices, applied in photometry, measuring devices, optical radiation measurement, etc., can solve the problems of different brightness of flicker, influence of light-emitting diode brightness, light-emitting diode flicker, etc.

Inactive Publication Date: 2010-07-07
INVENTEC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this test method has the following disadvantages: 1. The light-emitting diode will flicker, and the brightness of the flicker in different test environments is also different
2. The method of accessing data by the storage device will also affect the brightness of the LED
3. If the BIOS interrupt method is used, it will be because the BIOS currently does not support storage devices (such as hard disks).
Even if it is supported, the brightness emitted by the light-emitting diodes on it cannot meet the requirements of the target brightness

Method used

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  • Test method of light emitting diode of storage device and test tool thereof
  • Test method of light emitting diode of storage device and test tool thereof
  • Test method of light emitting diode of storage device and test tool thereof

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Embodiment Construction

[0042] The technical solutions of the present invention will be further described in more detail in conjunction with the accompanying drawings and specific embodiments.

[0043] The invention provides a method for testing the brightness of the light-emitting diode to which an independent storage device belongs. In addition to testing the writing of stored data, it can also provide brightness and corresponding testing for light-emitting diodes. Please refer to figure 1 As shown, it is a schematic diagram of the structure of the present invention. The present invention includes: a test tool 110 and a storage device 120 . The test tool 110 also includes a connection interface 121 , a processing unit 122 and a storage unit 123 .

[0044] The storage unit 123 is used for storing the test program 124 and the test data 125 . The processing unit 122 is used for executing the test program 124 and sending the test data 125 to the storage device 120 according to the test program 124 ...

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Abstract

The invention discloses a test method of a light emitting diode of a storage device and a test tool thereof. The test method and the test tool thereof are characterized by carrying out light-emitting test on the light emitting diode to which an independent storage device belongs. In the invention, the test tool and the storage device are comprised. The test tool also comprises a connecting interface, a processing unit and a storage unit, wherein the storage unit is used for storing a test program and test data; and the processing unit is used for executing the test program and transmitting the test data to the storage device according to the test program. The storage device at least comprises a connecting interface and a light-emitting diode. The processing unit is used for executing the test program, selecting a port of the storage device and transmitting the test data to the port, and enables the storage device to drive the light-emitting diode by the access to the port of the storage device.

Description

technical field [0001] The invention relates to a testing method of a light emitting diode and a testing tool thereof, in particular to a testing method of a light emitting diode of a storage device and a testing tool thereof. Background technique [0002] With the rapid and massive growth of information, the capacity of the storage device is gradually increased and accelerated. In order to allow the user to clearly identify whether the storage device is being accessed, generally a light emitting diode is provided on the storage device. When the storage device has data to be written / read, the storage device will drive the light emitting diode. During the data writing process, the light-emitting diode will affect the frequency and time of its light emission according to the frequency / time of writing. [0003] For the manufacturer, in order to test the operation state of the light emitting diode of the storage device. It is necessary to perform a large amount of data access...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01J1/00
Inventor 丁怀亮陈玄同
Owner INVENTEC CORP
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