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Image admeasuring apparatus and pattern lighting device thereof

A technology of image measuring instrument and pattern light, which is applied in the direction of measuring device, optical device, installation, etc., can solve the problems of optical imaging of workpieces that are difficult to be measured, and measurement of workpieces that cannot be measured.

Inactive Publication Date: 2010-09-08
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, when the smoothness of the surface of the measured workpiece is very high, such as a smooth glass sheet, it will be difficult for the optical device to perform optical imaging on the measured workpiece, and at this time the measured workpiece cannot be imaged. workpiece to be measured

Method used

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  • Image admeasuring apparatus and pattern lighting device thereof
  • Image admeasuring apparatus and pattern lighting device thereof
  • Image admeasuring apparatus and pattern lighting device thereof

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Embodiment Construction

[0013] The present invention will be further described in detail below in conjunction with the accompanying drawings and preferred embodiments.

[0014] refer to Figure 1 to Figure 5 A preferred embodiment of the image measuring instrument 1 of the present invention includes a workbench 2 parallel to the horizontal plane, a gantry 3 straddling the workbench 2, a top cover 4 fixed at the middle of the gantry 3, a Optical device 5 , a pattern light device 6 , an image capture device 7 and a light source, such as a ring light source 8 . The image measuring instrument 1 is also provided with an X-axis transmission system, a Y-axis transmission system and a Z-axis transmission system (not shown). The X-axis transmission system is used to drive the top cover 4 along such as figure 1 The X-axis of the shown mechanical coordinate system moves, and the Y-axis transmission system is used to drive the worktable 2 to move along the Y-axis of the mechanical coordinate system. The X-axi...

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Abstract

The invention relates to an image admeasuring apparatus, comprising an optical device, a pattern lighting device, an image extracting device and a light source. The light source is used for irradiating a workpiece to be tested. The optical device comprises a first lens, a second lens and a semi-transparent and semireflecting mirror, and is used for optically imaging the workpiece to be tested. The image extracting device is used for sensing the image of the workpiece to be tested and converting the image into an electrical signal to be transmitted to a computer system for processing. The pattern lighting device comprises a pattern light source and a pattern piece which are sequentially arranged. The semi-transparent and semi-reflecting mirror is arranged between the first lens and the second lens and is parallel to the second lens. The light emitted by the pattern light source sequentially passes through the pattern piece, the semi-transparent and semi-reflecting mirror and the second lens and projects to the surface of the workpiece to be tested so as to form the pattern on the pattern piece on the workpiece to be tested. The image admeasuring apparatus can quickly and conveniently focus the workpiece to be tested, which has higher surface smoothness.

Description

technical field [0001] The invention relates to an image measuring instrument and a pattern light device thereof. Background technique [0002] The image measuring instrument is a non-contact three-dimensional measuring equipment, which has the advantages of good flexibility, fast and high efficiency. It includes an image capture device and an optical device, which is used for optical imaging of the workpiece under test. The above image capture device is used to sense the image of the workpiece to be tested. However, when the smoothness of the surface of the measured workpiece is very high, such as a smooth glass sheet, it will be difficult for the optical device to perform optical imaging on the measured workpiece, and at this time the measured workpiece cannot be imaged. The workpiece is measured. Contents of the invention [0003] In view of the above, it is necessary to provide an image measuring instrument, which can focus on a measured workpiece with a high surface...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG02B27/144G02B27/40G02B7/32
Inventor 张旨光张恒
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD