Measurement stand and method of its electrical control

A technology of electrical control and measuring bench, applied in the field of measuring bench

Inactive Publication Date: 2010-09-22
HELMUT FISCHER & INSTITUT FUR ELECTRONIK & MESSTECHN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In order to meet the growing need for flexibility in performing measurements and reducing the number of disassembly and a

Method used

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  • Measurement stand and method of its electrical control
  • Measurement stand and method of its electrical control
  • Measurement stand and method of its electrical control

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Embodiment Construction

[0045] figure 1 The measuring bench 11 according to the invention is shown in perspective, figure 2for side view. The measuring bench 11 comprises a measuring table 12 on which individual test or measuring objects 14 can be placed directly or held by holders 16 . On the base of the measuring bench 11 or on the measuring table 12, a column 17 is arranged, and a housing 19 is installed on the column 17 and the threaded column 18 in a height-adjustable manner. By virtue of the two columns 17 , 18 being arranged next to each other, a parallel guidance that is easy to adjust in height can be achieved. The orientation of the housing 19 is effected by an adjustment mechanism 20 . The height can be set via set screw 21 . In addition, a clamping mechanism 22 is provided in order to fix the housing 19 at a certain height relative to the measuring table 12 .

[0046] On the side opposite to the columns 17 , 18 , a displacement member 23 is mounted on the housing 19 in a movable man...

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PUM

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Abstract

The invention relates to a measurement stand for holding a measuring probe intended in particular for measuring the thickness of thin layers, and to a method for controlling the measurement stand.

Description

technical field [0001] The invention relates to a method of electrically controlling a measuring gantry to provide a movement of at least one measuring probe traveling from a starting position to a measuring position, in particular for measuring the thickness of thin layers, and to a method for performing the Measuring bench for the method described above. Background technique [0002] DE 10 2005 034 515 A1 discloses a measuring stand for holding measuring probes designed for measuring the thickness of thin layers. The measuring bench comprises a housing in which the displacement member can be guided so that it moves up and down. At its end facing the object to be measured, a holder for fixing the measuring probe is provided. The up and down movement of the displacement member is initiated by a motor-controlled drive unit. The upper end position and the lower end position of the up and down movement of the displacement member are respectively detected by the detectors. T...

Claims

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Application Information

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IPC IPC(8): G01B5/00G01B5/06G01B7/06
CPCG01B7/105G01B5/0004G01B5/066G01B21/08G05B19/425G01B5/06G01B7/06
Inventor H·费希尔
Owner HELMUT FISCHER & INSTITUT FUR ELECTRONIK & MESSTECHN
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