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Optical waveguide test device

A test device and optical waveguide technology, applied in the field of optical waveguide, can solve problems such as low precision, poor repeatability, and difficult operation, and achieve the effects of convenient operation, novel structure, and high testing accuracy

Active Publication Date: 2011-12-21
INST OF ELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The object of the present invention is to provide an optical waveguide test device, which has a simple and practical structure and is easy to operate, which solves the problems of difficult operation, low precision and poor repeatability in the existing related technologies

Method used

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Embodiment

[0026] Embodiment: the base 1 is made of metal aluminum, with a size of 75mm×40mm×5mm, and the base 1 is provided with threaded holes 11 at different intervals as required for fixing the pole 5 in the prism fixture; the main pole 2 is made of stainless steel It is fixed to the side of the base 1 through bolts and screw holes; the crossbeam 6 is made of metal aluminum, with a size of 40mm×10mm×8mm, and the upper surface and one side of the crossbeam 6 are respectively provided with threaded holes for fastening screws 7, micro-motion tightening The fastening screw 9 penetrates firmly; the pressure block 8 is made of stainless steel and has an inverted L shape; the support rod 5 is made of stainless steel and has a diameter of 4mm, and the beam 6 is fixed on the support rod 5 by the fastening screw 7 . The optical waveguide 10 is an ion-exchanged planar glass optical waveguide with a size of 50mm×35mm×1mm; the coupling prisms 3 and 4 are isosceles right-angled prisms made of high ...

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Abstract

The invention discloses an optical waveguide test device, which relates to the optical waveguide technology and comprises a base, a main pole, an input coupling prism, an output coupling prism, and a prism fixture. Among them, the prism fixture is composed of a support rod, a beam, a fastening screw, a pressure block, and a micro-movement fastening screw. The support rod is fixed on the base, the cross beam is fixed on the support rod by a fastening screw, and the micro-movement fastening screw passes through the cross beam. Rotate connection with the pressure block. The optical waveguide is placed on the upper surface of the base, the two coupling prisms are under the pressure block, and the bottom surface of the coupling prism is in close contact with the optical waveguide by rotating the micro-motion fastening screw. The device of the present invention has the advantages of only needing to rotate the test device when adjusting the input coupling angle without adjusting the position of the light source at the same time, novel in structure, simple and practical, convenient in operation, high in test accuracy and good in repeatability.

Description

technical field [0001] The invention relates to the field of optical waveguide technology, and relates to an optical waveguide testing device, which is an important part used for optical waveguide parameter testing and optical waveguide sensing testing. Background technique [0002] Optical waveguide is an important integrated optical device with a wide range of applications. Prism coupling technique is a common method to excite guided modes in optical waveguides. In optical waveguide testing and optical waveguide sensing applications based on prism coupling, it is necessary to use incident light to excite guided modes at a specific input coupling angle. Since the prism and the optical waveguide are separate devices, it is easy to cause disadvantages such as low accuracy and poor repeatability during the combined test process. Therefore, the research and development of the optical waveguide testing device has been given high attention. For example, Chinese utility model pa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/00G01M11/02
Inventor 祁志美陈方
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI