Equipment for testing pins of electronic element products automatically

An automatic detection and electronic component technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems of manual intervention, error-prone, quality problems, etc., to save resources and management costs, high production efficiency, reduce the effect of time

Inactive Publication Date: 2010-10-13
曹旭阳
View PDF5 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above methods are time-consuming and labor-intensive, and there are too many manual interventions during the inspection process of the product, resulting in unstable factors
Especially in quality management, mistakes are more likely to occur, which can easily cause quality problems

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Equipment for testing pins of electronic element products automatically
  • Equipment for testing pins of electronic element products automatically
  • Equipment for testing pins of electronic element products automatically

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 2

[0051] The difference between embodiment 2 of the present invention and embodiment 1 is the structure of its feeding device, and the specific structure of the feeding device of present embodiment 2 is: as image 3 As shown, the feeding device is a magazine device 3, and the magazine device is a magazine base 41 and a magazine 42 installed in the magazine base, the magazine top is inserted with a material pipe 43 for conveying electronic component products, and the magazine The lower part is connected to the detection slideway.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses equipment for testing the pins of electronic element products automatically, which consists of a machine shell, a chute device arranged on the machine shell obliquely, an air cylinder device arranged on the chute device, a feeding mechanism arranged on the upper part of the chute device and a material collecting device arranged in the lower middle part of the chute device, wherein the chute device is comprised of an upper testing chute and a lower testing chute, which both are provided an industrial camera component connected with an external computer; and the chute device is also provided with a plurality of pairs of sensors. Compared with the prior art, the equipment has the advantages of saving resources and management cost, solving the problem of product quality misjudgement, making product quality more stable, reducing product wire replacement time, improving equipment utilizability, saving labor, along with high production efficiency and high productivity stability, high variability and high application elasticity.

Description

technical field [0001] The device of the present invention is a detection device, which is mainly used for the detection of some electronic component products. It mainly detects the flatness of the product pins and the spacing of the pins, replacing the current manual inspection. Background technique [0002] At present, after the production process of pin products is completed, they are mostly inspected directly by humans directly or with inspection instruments one by one, and then manually classified good products and defective products. The above methods are time-consuming and labor-intensive, and there are too many manual interventions in the product inspection process, which leads to unstable factors. In particular, errors are more likely to occur in quality management, which can easily cause quality problems. Contents of the invention [0003] The device of the present invention is to overcome the deficiencies of the prior art and provide a device that uses an indu...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/30G01B11/14
Inventor 曹旭阳
Owner 曹旭阳
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products