Method and device for analyzing test coverage automatically aiming at automatic test system
A technology of automatic test system and automatic analysis device, which is applied in the direction of detecting faulty computer hardware to achieve the effect of improving work efficiency and
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[0026] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.
[0027] System test requirements, or test objectives, generally have a top-down tree-like hierarchical structure, the upper-level test requirements are the overall requirements, and the lower-level test requirements are the refinement of the overall requirements. For example, in the test requirements of an electronic device, to realize the "power supply system test", it is necessary to test the voltage value and current value of the power supply separately. The "power system test" in the upper layer is an overall requirement, and the two items of "current test" and "voltage test" in the lower layer are the refinement of the power system test requirements. The test of the power system is divided into "current test" and " Voltage test" two sub-items are carried out. In the present invention, the logical structure of the test requirement is described by ...
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