Method for measuring small facula intensity distribution based on two-dimension subdivision method

A technology of intensity distribution and measurement method, which is applied in the field of measuring the intensity distribution of tiny light spots, can solve the problems of spot intensity distribution measurement, inability to distribute uneven energy, etc., and achieves the effect of a simple method.
CN101907490AInactive Publication Date: 2010-12-08HARBIN INST OF TECH
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Applications(China)
Current Assignee / Owner
HARBIN INST OF TECH
Publication Date
2010-12-08
Estimated Expiration
Not applicable Β· inactive patent

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Abstract

The invention provides a method for measuring small facula intensity distribution base on a two-dimension subdivision method, relating to a method for measuring the small facula intensity distribution, solving the problem that the intensity distribution measurement can not be carried out on the small facula with nonuniform energy distribution or extremely small size currently. The measuring method completely irradiates the incident facula on an image element of the photosensitive detecting surface of a CCD detector, records gray level images in various scanning states in a snakelike scanning mode, and obtains the intensity distribution of the incident facula finally through calculation. The invention can carry out direct measurement on the facula with nonuniform energy distribution or extremely small size, and is suitable for the filed of tiny facula measuring.
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Description

technical field

[0001] The invention relates to a method for measuring the intensity distribution of tiny light spots. Background technique

[0002] The spot intensity distribution is one of the important parameters of the laser system. The existing spot intensity distribution measurement techniques can be mainly divided into the following categories: knife-edge scanning method, slit scanning method, iris method, and CCD camera method. However, in many laser application fields such as laser processing and material processing, it is necessary to focus the beam before proceeding to the next step. In this case, due to the extremely small spot size or uneven energy distribution, these methods often cannot correct the spot. direct measurement of the intensity distribution. Contents of the invention

[0003] The purpose of the present invention is to solve the current problem that the intensity distribution of light spots with uneven energy distribution or small size cannot be ...

Claims

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